메뉴 건너뛰기




Volumn 33, Issue 7, 2012, Pages 991-993

Quantum capacitance in N-polar GaN/AlGaN/GaN heterostructures

Author keywords

AlGaN GaN high electron mobility transistor (HEMT); capacitance voltage (C V); N polar GaN; negative quantum; quantum capacitance; quantum displacement

Indexed keywords

ALGAN/GAN HIGH ELECTRON-MOBILITY TRANSISTORS; CAPACITANCE VOLTAGE; N-POLAR; NEGATIVE QUANTUM; QUANTUM CAPACITANCE; QUANTUM DISPLACEMENT;

EID: 84862852889     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2012.2196973     Document Type: Article
Times cited : (22)

References (20)
  • 1
    • 79955534584 scopus 로고    scopus 로고
    • InAlN/GaN HEMTs with AlGaN back barriers
    • May
    • D. S. Lee, X. Gao, S. Guo, and T. Palacios, "InAlN/GaN HEMTs with AlGaN back barriers," IEEE Electron Device Lett., vol. 32, no. 5, pp. 617-619, May 2011.
    • (2011) IEEE Electron Device Lett. , vol.32 , Issue.5 , pp. 617-619
    • Lee, D.S.1    Gao, X.2    Guo, S.3    Palacios, T.4
  • 3
    • 0001556024 scopus 로고    scopus 로고
    • Monte Carlo calculation of velocity-field characteristics of wurtzite GaN
    • U. V. Bhapkar and M. S. Shur, "Monte Carlo calculation of velocity-field characteristics of wurtzite GaN," J. Appl. Phys., vol. 82, no. 4, pp. 1649-1655, Aug. 1997. (Pubitemid 127590041)
    • (1997) Journal of Applied Physics , vol.82 , Issue.4 , pp. 1649-1655
    • Bhapkar, U.V.1    Shur, M.S.2
  • 4
    • 0000370866 scopus 로고    scopus 로고
    • Two-dimensional electron gases in Ga-face and N-face AlGaN/GaN heterostructures grown by plasmainduced molecular beam epitaxy and metalorganic chemical vapor deposition on sapphire
    • Apr.
    • R. Dimitrov, M. Murphy, J. Smart, W. Schaff, J. R. Shealy, L. F. Eastman, O. Ambacher, and M. Stutzmann, "Two-dimensional electron gases in Ga-face and N-face AlGaN/GaN heterostructures grown by plasmainduced molecular beam epitaxy and metalorganic chemical vapor deposition on sapphire," J. Appl. Phys., vol. 87, no. 7, pp. 3375-3380, Apr. 2000.
    • (2000) J. Appl. Phys. , vol.87 , Issue.7 , pp. 3375-3380
    • Dimitrov, R.1    Murphy, M.2    Smart, J.3    Schaff, W.4    Shealy, J.R.5    Eastman, L.F.6    Ambacher, O.7    Stutzmann, M.8
  • 5
    • 34548418932 scopus 로고    scopus 로고
    • N-polar GaN/AlGaN/GaN high electron mobility transistors
    • Aug.
    • S. Rajan, A. Chini, M. H. Wong, J. S. Speck, and U. K. Mishra, "N-polar GaN/AlGaN/GaN high electron mobility transistors," J. Appl. Phys., vol. 102, no. 4, pp. 044-501, Aug. 2007.
    • (2007) J. Appl. Phys. , vol.102 , Issue.4 , pp. 044-501
    • Rajan, S.1    Chini, A.2    Wong, M.H.3    Speck, J.S.4    Mishra, U.K.5
  • 7
    • 84879596320 scopus 로고    scopus 로고
    • Trap-related delay analysis of self-aligned N-polar GaN/InAlN HEMTs with record extrinsic gm of 1105 mS/mm
    • Santa Barbara, CA
    • Nidhi, S. Dasgupta, J. Lu, F.Wu, S. Keller, J. S. Speck, and U. K. Mishra, "Trap-related delay analysis of self-aligned N-polar GaN/InAlN HEMTs with record extrinsic gm of 1105 mS/mm," in Proc. Device Res. Conf., Santa Barbara, CA, 2011, pp. 279-280.
    • (2011) Proc. Device Res. Conf. , pp. 279-280
    • Dasgupta, N.S.1    Lu, J.2    Wu, F.3    Keller, S.4    Speck, J.S.5    Mishra, U.K.6
  • 9
    • 77951165875 scopus 로고    scopus 로고
    • Ultralow nonalloyed ohmic contact resistance to self aligned N-polar GaN high electron mobility transistors by In(Ga)N regrowth
    • Apr.
    • S. Dasgupta, Nidhi, D. F. Brown, F. Wu, S. Keller, J. S. Speck, and U. K. Mishra, "Ultralow nonalloyed ohmic contact resistance to self aligned N-polar GaN high electron mobility transistors by In(Ga)N regrowth," Appl. Phys. Lett., vol. 96, no. 14, pp. 143 504-1-143 504-3, Apr. 2010.
    • (2010) Appl. Phys. Lett. , vol.96 , Issue.14 , pp. 1435041-1435043
    • Dasgupta, S.1    Brown, F.N.D.2    Wu, F.3    Keller, S.4    Speck, J.S.5    Mishra, U.K.6
  • 10
    • 79952042447 scopus 로고    scopus 로고
    • Simulation of short-channel effects in N-and Ga-polar AlGaN/GaN HEMTs
    • Mar.
    • P. S. Park and S. Rajan, "Simulation of short-channel effects in N-and Ga-polar AlGaN/GaN HEMTs," IEEE Trans. Electron Devices, vol. 58, no. 3, pp. 704-708, Mar. 2011.
    • (2011) IEEE Trans. Electron Devices , vol.58 , Issue.3 , pp. 704-708
    • Park, P.S.1    Rajan, S.2
  • 11
    • 36549091403 scopus 로고
    • Quantum capacitance devices
    • Feb.
    • S. Luryi, "Quantum capacitance devices," Appl. Phys. Lett., vol. 52, no. 6, pp. 501-503, Feb. 1988.
    • (1988) Appl. Phys. Lett. , vol.52 , Issue.6 , pp. 501-503
    • Luryi, S.1
  • 13
    • 12844286067 scopus 로고    scopus 로고
    • Structural properties of GaN buffer layers on 4H-SiC(0001) grown by plasma-assisted molecular beam epitaxy for high electron mobility transistors
    • DOI 10.1143/JJAP.43.L1520
    • P. Waltereit, C. Poblenz, S. Rajan, F. Wu, U. K. Mishra, and J. S. Speck, "Structural properties of GaN buffer layers on 4H-SiC(0001) grown by plasma-assisted molecular beam epitaxy for high electron mobility transistors," Jpn. J. Appl. Phys., vol. 43, no. 12A, pp. L1 520-L1 523, 2004. (Pubitemid 40169168)
    • (2004) Japanese Journal of Applied Physics, Part 2: Letters , vol.43 , Issue.12 A
    • Waltereit, P.1    Poblenz, C.2    Rajan, S.3    Wu, F.4    Mishra, U.K.5    Speck, J.S.6
  • 14
    • 84655165935 scopus 로고    scopus 로고
    • Anomalous output conductance in N-polar GaN-based MISHEMTs
    • Santa Barbara, CA
    • M. H. Wong, U. Singisetti, J. Lu, J. S. Speck, and U. K. Mishra, "Anomalous output conductance in N-polar GaN-based MISHEMTs," in Proc. Device Res. Conf., Santa Barbara, CA, 2011, pp. 211-212.
    • (2011) Proc. Device Res. Conf. , pp. 211-212
    • Wong, M.H.1    Singisetti, U.2    Lu, J.3    Speck, J.S.4    Mishra, U.K.5
  • 15
  • 16
    • 0001296663 scopus 로고    scopus 로고
    • Polarization fields determination in AlGaN/GaN heterostructure field-effect transistors from charge control analysis
    • J. A. Garrido, J. L. Sánchez-Rojas, A. Jiménez, E. Muñoz, F. Omnes, and P. Gibart, "Polarization fields determination in AlGaN/GaN heterostructure field-effect transistors from charge control analysis," Appl. Phys. Lett., vol. 75, no. 16, pp. 2407-2409, Oct. 1999. (Pubitemid 129564295)
    • (1999) Applied Physics Letters , vol.75 , Issue.16 , pp. 2407-2409
    • Garrido, J.A.1    Sanchez-Rojas, J.L.2    Jimenez, A.3    Munoz, E.4    Omnes, F.5    Gibart, P.6
  • 17
    • 33845771340 scopus 로고    scopus 로고
    • Study of two-subband population in Fe-doped AlxGa1?xN/GaN heterostructures by persistent photoconductivity effect
    • Dec.
    • I. Lo, J. K. Tsai, M. H. Gau, Y. L. Chen, Z. J. Chang, W. T. Wang, J. C. Chiang, and K. R. Wang, "Study of two-subband population in Fe-doped AlxGa1?xN/GaN heterostructures by persistent photoconductivity effect," Phys. Rev. B, vol. 74, no. 24, p. 245 325, Dec. 2006.
    • (2006) Phys. Rev. B , vol.74 , Issue.24 , pp. 245325
    • Lo, I.1    Tsai, J.K.2    Gau, M.H.3    Chen, Y.L.4    Chang, Z.J.5    Wang, W.T.6    Chiang, J.C.7    Wang, K.R.8
  • 19
    • 77958495110 scopus 로고    scopus 로고
    • Lateral confinement of electrons in vicinal N-polar AlGaN/GaN heterostructure
    • Oct.
    • D. Nath, S. Keller, Y. Hsieh, S. P. DenBaars, U. K. Mishra, and S. Rajan, "Lateral confinement of electrons in vicinal N-polar AlGaN/GaN heterostructure," Appl. Phys. Lett., vol. 97, no. 16, pp. 162 106-1-162 106-3, Oct. 2010.
    • (2010) Appl. Phys. Lett. , vol.97 , Issue.16 , pp. 1621061-1621063
    • Nath, D.1    Keller, S.2    Hsieh, Y.3    Denbaars, S.P.4    Mishra, U.K.5    Rajan, S.6
  • 20
    • 80053523545 scopus 로고    scopus 로고
    • Electrical properties of atomic layer deposited aluminum oxide on gallium nitride
    • Sep.
    • M. Esposto, S. Krishnamoorthy, D. Nath, S. Bajaj, T. Hung, and S. Rajan, "Electrical properties of atomic layer deposited aluminum oxide on gallium nitride," Appl. Phys. Lett., vol. 99, no. 13, pp. 133 503-1-133 503-3, Sep. 2011.
    • (2011) Appl. Phys. Lett. , vol.99 , Issue.13 , pp. 1335031-1335033
    • Esposto, M.1    Krishnamoorthy, S.2    Nath, D.3    Bajaj, S.4    Hung, T.5    Rajan, S.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.