Ferroelectric behavior in bismuth ferrite thin films of different thickness

ACS Applied Materials and Interfaces

Volumn 3, Issue 9, 2011, Pages 3261-3263

  Wu, Jiagang ^a   Wang, John ^b   Xiao, Dingquan ^a   Zhu, Jianguo ^a  

^a SICHUAN UNIVERSITY   (China)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

bismuth ferrite; ferroelectric properties; thickness dependence

Indexed keywords

BISMUTH FERRITES; COLUMNAR STRUCTURES; DIELECTRIC BEHAVIOR; DIFFERENT THICKNESS; FERROELECTRIC BEHAVIOR; FERROELECTRIC PROPERTY; LOW DIELECTRIC LOSS; RADIO FREQUENCY SPUTTERING; THICKNESS DEPENDENCE;

BISMUTH; DIELECTRIC LOSSES; FERRITE; FERRITES; FERROELECTRICITY; FILM THICKNESS; SILICON COMPOUNDS; THIN FILMS;

FERROELECTRIC FILMS;

BISMUTH; FERRIC ION; FERRITE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRICITY; X RAY DIFFRACTION;

BISMUTH; CRYSTALLIZATION; ELECTRICITY; FERRIC COMPOUNDS; X-RAY DIFFRACTION;

EID: 84862833154     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am200801u     Document Type: Article

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