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Thin Solid Films

Volumn 520, Issue 9, 2012, Pages 3458-3463

Spectroscopic investigation on phase transitions for Ge 2Sb 2Te 5 in a wide photon energy and high temperature region

(5) Seo, Y K a Chung, J S a Lee, Y S a Choi, E J b Cheong, B c

a Soongsil University (South Korea)

b University of Seoul (South Korea)

c Korea Institute of Science and Technology (South Korea)

Author keywords

Amorphous phase; Crystalline phase; Ellipsometry; Ge 2Sb 2Te 5 (GST); Optical constants

Indexed keywords

AMORPHOUS PHASE; CRYSTALLINE PHASE; FACE-CENTERED CUBIC; FCC PHASE; HIGH TEMPERATURE; HIGH TEMPERATURE MEASUREMENT; INTER-BAND TRANSITION; OPTICAL ANALYSIS; OPTICAL CONDUCTIVITY SPECTRA; OPTICAL RESPONSE; OPTICAL SPECTRA; PHOTON ENERGY; PHOTON ENERGY REGIONS; ROOM TEMPERATURE; SPECTROSCOPIC INVESTIGATIONS; TEMPERATURE DEPENDENCE; THEORETICAL STUDY; THREE PHASIS; UV REGION; VISIBLE REGION;

CRYSTALLINE MATERIALS; ELECTRONIC PROPERTIES; ELLIPSOMETRY; GERMANIUM; OPTICAL CONDUCTIVITY; OPTICAL CONSTANTS; PHASE TRANSITIONS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ELLIPSOMETRY; TEMPERATURE MEASUREMENT; TRANSPORT PROPERTIES;

AMORPHOUS FILMS;

EID: 84862812879 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.12.043 Document Type: Article

Times cited : (10)

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