High resolution optical spectroscopy of air-induced electrical instabilities in n-type polymer semiconductors

Advanced Materials

Volumn 24, Issue 25, 2012, Pages 3367-3372

  Di Pietro, Riccardo ^a   Sirringhaus, Henning ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

air stability; bias stress; degradation; n type polymer; optical spectroscopy

Indexed keywords

ACCUMULATION LAYERS; AIR STABILITY; BIAS STRESS; CHARGE ACCUMULATION; DEVICE PERFORMANCE; ELECTRICAL INSTABILITY; HIGH RESOLUTION; ONSET VOLTAGES; OPTICAL SPECTROSCOPY; POLYMER SEMICONDUCTORS;

DEGRADATION; ORGANIC FIELD EFFECT TRANSISTORS; REDOX REACTIONS;

POLYMERS;

OXYGEN; POLYMER; WATER;

AIR; ARTICLE; CHEMISTRY; ELECTRICITY; ELECTRODE; OXIDATION REDUCTION REACTION; SEMICONDUCTOR;

AIR; ELECTRICITY; ELECTRODES; OXIDATION-REDUCTION; OXYGEN; POLYMERS; SEMICONDUCTORS; WATER;

EID: 84862749567     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201200829     Document Type: Article

References (24)

1. H. E. Katz, A. J. Lovinger, J. Johnson, C. Kloc, T. Siegrist, W. Li, Y. Y. Lin, A. Dodabalapur, Nature 2000, 404, 478-481.
2. A. Facchetti, Y. Deng, A. C. Wang, Y. Koide, H. Sirringhaus, T. J. Marks, R. H. Friend, Angew. Chem. Int. Ed. 2000, 112, 4721-4725.
3. C. D. Frisbie, C. R. Newman, D. A. da Silva, J. L. Bredas, P. C. Ewbank, K. R. Mann, Chem. Mater. 2004, 16, 4436-4451.
4. D. M. de Leeuw, M. M. J. Simenon, A. R. Brown, R. E. F. Einerhand, Synthetic Metals 1997, 87, 53-59.
5. X. W. Zhan, A. Facchetti, S. Barlow, T. J. Marks, M. A. Ratner, M. R. Wasielewski, S. R. Marder, Adv. Mater. 2011, 23, 268-284.
6. B. A. Jones, A. Facchetti, M. R. Wasielewski, T. J. Marks, J. Am. Chem. Soc. 2007, 129, 15259-15278.
7. Z. Wang, C. Kim, A. Facchetti, T. J. Marks, J. Am. Chem. Soc. 2007, 129, 13362-13363.
8. B. A. Jones, A. Facchetti, T. J. Marks, M. R. Wasielewski, Chem. Mater. 2007, 19, 2703-2705.
9. P. R. L. Malenfant, C. D. Dimitrakopoulos, J. D. Gelorme, L. L. Kosbar, T. O. Graham, A. Curioni, W. Andreoni, Appl. Phys. Lett. 2002, 80, 2517-2519.
10. J. Anthony, A. Facchetti, M. Heeney, S. R. Marder, X. Zhan, Adv. Mater. 2010, 22, 3876-3892.
11. M. Matters, D. M. de Leeuw, P. T. Herwig, A. R. Brown, Synt. Met. 1999, 102, 998-999.
12. A. Salleo, F. Endicott, R. A. Street, Appl. Phys. Lett. 2005, 86, 263505.
13. S. G. J. Mathijssen, M. Colle, H. Gomes, E. C. P. Smits, B. de Boer, I. McCulloch, P. A. Bobbert, D. M. de Leeuw, Adv. Mater. 2007, 19, 2785-2789.
14. A. Sharma, S. G. J. Mathijssen, E. C. P. Smits, M. Kemerink, D. M. de Leeuw, P. A. Bobbert, Phys. Rev. B 2010, 82, 075322.
15. R. J. Chesterfield, J. C. McKeen, C. R. Newman, C. D. Frisbie, P. C. Ewbank, K. R. Mann, L. L. Miller, J. Appl. Phys. 2004, 95, 6396-6405.
16. T. D. Anthopoulos, G. C. Anyfantis, G. C. Papavassiliou, D. M. de Leeuw, Appl. Phys. Lett. 2007, 90, 122105.
17. Z. H. Chen, Y. Zheng, H. Yan, A. Facchetti, J. Am. Chem. Soc. 2009, 131, 8-9.
18. H. Yan, Z. H. Chen, Y. Zheng, C. Newman, J. R. Quinn, F. Dötz, M. Kastler, A. Facchetti, Nature 2009, 457, 679-687.
19. M. C. Gwinner, R. Di Pietro, Y. Vaynzof, K. J. Greenberg, P. K. H. Ho, R. H. Friend, H. Sirringhaus, Adv. Funct. Mater. 2011, 21, 1432-1441.
20. P. J. Brown, H. Sirringhaus, M. Harrison, M. Shkunov, R. H. Friend, Phys. Rev. B 2001, 63, 125204.
21. M. Caironi, M. Bird, D. Fazzi, Z. Chen, R. Di Pietro, C. Newman, A. Facchetti, H. Sirringhaus, Adv. Funct. Mater. 2011, 21, 3371-3381.
22. C. A. Eldering, A. Knoesen, S. T. Kowel, J. Appl. Phys. 1991, 69, 3676-3686.
23. M. Bird, PhD dissertation, Cambridge University, 2010.
24. D. T. Turner, Polymer 1987, 28, 293-296.