Cyanonaphthalene diimide semiconductors for air-stable, flexible, and optically transparent n-channel field-effect transistors

Chemistry of Materials

Volumn 19, Issue 11, 2007, Pages 2703-2705

  Jones, Brooks A ^a   Facchetti, Antonio ^a   Marks, Tobin J ^a   Wasielewski, Michael R ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CYANONAPHTHALENE DIIMIDE; ENVIRONMENTAL STABILITY; NAPHTHALENE DIIMIDE (NDI);

ATOMIC FORCE MICROSCOPY; ELECTRON MOBILITY; FIELD EFFECT TRANSISTORS; NITROGEN COMPOUNDS; THIN FILMS; TRANSPARENCY; X RAY DIFFRACTION;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 34250219302     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm0704579     Document Type: Article

References (26)

1. (a) Printed Organic and Molecular Electronics; Gamota, D. R., Brazis, P., Kalyanasundaram, K., Zhang, J., Eds.; Kluwer Academic Publishers: New York, 2004; p 695.
2. (b) Malliaras, G.; Friend, R. Phys. Today 2005, 58, 53-58.
3. (c) Katz, H. E.; Bao, A. J. Phys. Chem. B 2000, 104, 671-678.
4. (a) Wang, L.; Yoon, M.-H.; Lu, G.; Yang, Y.; Facchetti, A.; Marks, T. J. Nat. Mater. 2006, 5, 893-900.
5. (b) Artukovic, E.; Kaempgen, M.; Hecht, D.S.; Roth, S.; Grüner, G. Nano Lett. 2005, 5, 757-760.
6. (c) Hoffman, R. L.; Norris, B. J.; Wager, J. F. Appl. Phys. Lett. 2003, 82, 733-735.
7. (d) Masuda, S.; Kitamura, K.; Okumura, Y.; Miyatake, S.; Tabata, H.; Kawai, T. J. Appl. Phys. 2003, 93, 1624-1630.
8. Turro, N. J. Modern Molecular Photochemistry; University Science Books: Sausalito, CA, 1991; p 628.
9. (a) Garnier, F.; Deloffre, F.; Horowitz, G.; Hajlaoui, R. Synth. Met. 1993, 57, 4747-54.
10. (b) Hutchison, G. R.; Ratner, M. A.; Marks, T. J. J. Am. Chem. Soc. 2005, 127, 2339-2350.
11. See for example: (a) Ohta, H.; Kambayashi, T.; Nomura, K.; Hirano, M.; Ishikawa, K.; Takezoe, H.; Hosono, H. Adv. Mater. 2004, 16, 312-316.
12. (b) Choi, J.-M.; Hwang, D. K.; Kim, J. H.; Im, S. Appl. Phys. Lett. 2005, 86, 123505.
13. (a) Ahrens, M. J.; Fuller, M. J.; Wasielewski, M. R. Chem. Mater. 2003, 15, 2684-2686.
14. (b) Jones, B. A.; Ahrens, M. J.; Yoon, M.-H.; Facchetti, A.; Marks, T. J.; Wasielewski, M. R. Angew. Chem., Int. Ed. 2004, 43, 6363-6366.
15. (c) Jung, T.; Yoo, B.; Wang, L.; Jones, B. A.; Facchetti, A.; Wasielewski, M. R.; Marks, T. J.; Dodabalapur, A. Appl. Phys. Lett. 2006, 58, 183102.
16. (d) Yoo, B.; Jung, T.; Basu, D.; Dodabalapur, A.; Jones, B. A.; Facchetti, A.; Wasielewski, M. R.; Marks, T. J., Appl. Phys. Lett. 2006, 88, 082104.
17. (e) Yoo, B.; Madgavkar, A.; Jones, B. A.; Nadkarni, S.; Facchetti, A.; Dimmler, D.; Wasielewski, M. R.; Marks, T. J.; Dodabalapur, A. IEEE Electron Device Lett. 2006, 27, 737-739.
18. (a) Katz, H. E.; Johnson, J.; Lovinger, A. J.; Li, W. J. Am. Chem. Soc. 2000, 122, 7787-7792.
19. (b) Katz, H. E.; Lovinger, A. J.; Johnson, J.; Kloc, C.; Seigrist, T.; Li, W.; Lin, Y.-Y.; Dodabalapur, A. Nature 2000, 404, 478-481.
20. (c) Katz, H. E.; Otsuki, J.; Yamazaki, K.; Suka, A.; Takido, T.; Lovinger, A. J.; Raghavachari, K. Chem. Lett. 2003, 32, 508-509.
21. (d) Katz, H. E.; Siegrist, T.; Schön, J. H.; Kloc, C.; Batlogg, B.; Lovinger, A. J.; Johnson, J. ChemPhysChem 2001, 3, 167-172.
22. (a) Thalacker, C.; Miura, A.; De Feyter, S.; De Schryver, F. C.; Würthner, F. Org. Biomol. Chem. 2005, 3, 414-422.
23. (b) Würthner, F.; Ahmed, S.; Thalacker, C.; Debaerdemaeker, T. Chem-Eur. J. 2002, 8, 4742-4750.
24. (c) Thalacker, C.; Röger, C.; Würthner, F. J. Org. Chem. 2006, 71, 8098-8105.
25. (d) Würthner, F.; Stepanenko, V.; Chen, Z.; Saha-Moller, C. R.; Kocher, N.; Stalke, D. J. Org. Chem. 2004, 69, 7933-7939.
26. Details of transparent device fabrication are contained in the Supporting Information.