Synthesis and attachment of silver nanowires on atomic force microscopy cantilevers for tip-enhanced Raman spectroscopy

Journal of Raman Spectroscopy

Volumn 43, Issue 6, 2012, Pages 745-749

  Brodard, Pierre ^a   Bechelany, Mikhael ^b   Philippe, Laetitia ^a   Michler, Johann ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

alumina template; electrochemical deposition; nanowires; silver; TERS

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; DIFFRACTION; ELECTROCHEMICAL DEPOSITION; NANOCANTILEVERS; RAMAN SPECTROSCOPY; REDUCTION; SILVER;

ALUMINA TEMPLATE; ATOMIC FORCE MICROSCOPY CANTILEVERS; ELECTROCHEMICAL DEPOSITION; METAL PARTICLE; METALLICS; RAMAN SIGNAL; SILVER NANOWIRES; SURFACE ENHANCED RAMAN SPECTROSCOPY; TERS; TIP-ENHANCED RAMAN SPECTROSCOPY;

NANOWIRES;

EID: 84862575402     PISSN: 03770486     EISSN: 10974555     Source Type: Journal    
DOI: 10.1002/jrs.3091     Document Type: Article

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