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Volumn 85, Issue 23, 2012, Pages

Quantitative analysis of nanoripple and nanoparticle patterns by grazing incidence small-angle x-ray scattering 3D mapping

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Indexed keywords


EID: 84862181016     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.235415     Document Type: Article
Times cited : (31)

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