Ripple structure of crystalline layers in ion-beam-induced Si wafers

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 12, 2004, Pages

  Hazra, S ^a   Chini, T K ^a   Sanyal, M K ^a   Grenzer, J ^b   Pietsch, U ^b  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CRYSTAL; DENSITY; GRAZING INCIDENCE DIFFRACTION; RADIATION DOSE; X RAY DIFFRACTION;

EID: 19744382457     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.121307     Document Type: Article

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