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Volumn 84, Issue 3, 2011, Pages

Polycrystalline Ni thin films on nanopatterned Si substrates: From highly conformal to nonconformal anisotropic growth

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EID: 79961239735     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.035423     Document Type: Article
Times cited : (26)

References (42)
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    • See
    • See [http://www.esrf.eu/UsersAndScience/Experiments/TBS/ISG/maxipix] for further information on the MAXIPIX detector.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.