Burn-in and thermal cyclic tests to determine the short-term reliability of a thin film resistance temperature detector

Microelectronics Reliability

Volumn 52, Issue 7, 2012, Pages 1389-1395

  Post, Julian W ^a   Bhattacharyya, A ^b  

^a ETAS 329N   (United States)

^b University of Arkansas at Little Rock ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENZOCYCLOBUTENE; BURN-IN; BURN-IN TEST; CONDUCTIVE PATHS; ELECTRICAL RESISTIVITY; ENCAPSULATION LAYER; EXPERIMENTAL DATA; FILM RESISTANCE; INERT GAS ATMOSPHERE; LOW PRESSURES; THERMAL CYCLIC TESTS; THERMAL FAILURE;

ATMOSPHERIC PRESSURE; BUTENES; DEGRADATION; ELECTRIC CONDUCTIVITY; INERT GASES; THIN FILMS;

TEMPERATURE MEASURING INSTRUMENTS;

EID: 84861821665     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2012.02.021     Document Type: Article

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