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Volumn , Issue , 2005, Pages 110-112

MEMS design for fabrication

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; CODES (STANDARDS); COMPUTER SIMULATION; COST ACCOUNTING; PARAMETER ESTIMATION; PRODUCT DESIGN;

EID: 33749056162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMENS.2005.67     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 2
    • 0036735411 scopus 로고    scopus 로고
    • A simple method for determining linear thermal expansion coefficients of thin films
    • C.H. Pan, "A Simple Method for Determining Linear Thermal Expansion Coefficients of Thin Films," Journal of Micromechanics and Microengineering, Vol. 12, (2002), pp. 548-555.
    • (2002) Journal of Micromechanics and Microengineering , vol.12 , pp. 548-555
    • Pan, C.H.1
  • 4
    • 7444223603 scopus 로고    scopus 로고
    • Mechanical property characterization of LPCVD silicon nitride thin films at cryogenic temperatures
    • W.H. Chaung, T. Luger, R.K. Fettig, and R. Ghodssi, "Mechanical Property Characterization of LPCVD Silicon Nitride Thin Films at Cryogenic Temperatures," Journal of Microelectromechanical Systems, Vol. 13, No. 5, (2004), pp. 870-879.
    • (2004) Journal of Microelectromechanical Systems , vol.13 , Issue.5 , pp. 870-879
    • Chaung, W.H.1    Luger, T.2    Fettig, R.K.3    Ghodssi, R.4
  • 5
    • 0034275647 scopus 로고    scopus 로고
    • In situ measurement of residual stresses in micromachined thin films using a specimen with composite-layered cantilevers
    • Y.H. Min, and Y.K. Kim, "In Situ Measurement of Residual Stresses in Micromachined Thin films Using a Specimen with Composite-Layered Cantilevers," Journal of Micromechanics and Microengineering, Vol. 10, (2000), pp. 314-321.
    • (2000) Journal of Micromechanics and Microengineering , vol.10 , pp. 314-321
    • Min, Y.H.1    Kim, Y.K.2
  • 6
    • 0141482405 scopus 로고    scopus 로고
    • High-cycle fatigue of micron-scale polycrystalline silicon films: Fracture mechanics analyses of the role of silica/silicon interface
    • C.L. Muhlstein, and R.O. Ritchie, "High-Cycle Fatigue of Micron-Scale Polycrystalline Silicon Films: Fracture Mechanics Analyses of the Role of Silica/Silicon Interface," International Journal of Fracture, Vol. 119/120, (2003), pp. 449-474.
    • (2003) International Journal of Fracture , vol.119-120 , pp. 449-474
    • Muhlstein, C.L.1    Ritchie, R.O.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.