-
1
-
-
0002395851
-
Multi-disciplinary CAD systems for MEMS
-
M.G. Giridharan, P. Stout, H.Q. Yang, M. Athavale, P. Dionne, and A. Przekwas, "Multi-Disciplinary CAD Systems for MEMS," Journal of Modeling and Simulations of Microsystems, Vol. 2, No. 1, (2001), pp. 43-50.
-
(2001)
Journal of Modeling and Simulations of Microsystems
, vol.2
, Issue.1
, pp. 43-50
-
-
Giridharan, M.G.1
Stout, P.2
Yang, H.Q.3
Athavale, M.4
Dionne, P.5
Przekwas, A.6
-
2
-
-
0036735411
-
A simple method for determining linear thermal expansion coefficients of thin films
-
C.H. Pan, "A Simple Method for Determining Linear Thermal Expansion Coefficients of Thin Films," Journal of Micromechanics and Microengineering, Vol. 12, (2002), pp. 548-555.
-
(2002)
Journal of Micromechanics and Microengineering
, vol.12
, pp. 548-555
-
-
Pan, C.H.1
-
3
-
-
0030704418
-
Measurements of Young's modulus, Poisson's ratio and tensile strength of polysilicon
-
Nagoya, Japan.
-
W.N. Sharpe, B. Yaun, and R. Vaidyanathan, "Measurements of Young's Modulus, Poisson's Ratio and Tensile Strength of polysilicon," Proceedings of the Tenth IEEE International Workshop on Microelectromechanical Systems, Nagoya, Japan. (1997), PP. 424-429.
-
(1997)
Proceedings of the Tenth IEEE International Workshop on Microelectromechanical Systems
, pp. 424-429
-
-
Sharpe, W.N.1
Yaun, B.2
Vaidyanathan, R.3
-
4
-
-
7444223603
-
Mechanical property characterization of LPCVD silicon nitride thin films at cryogenic temperatures
-
W.H. Chaung, T. Luger, R.K. Fettig, and R. Ghodssi, "Mechanical Property Characterization of LPCVD Silicon Nitride Thin Films at Cryogenic Temperatures," Journal of Microelectromechanical Systems, Vol. 13, No. 5, (2004), pp. 870-879.
-
(2004)
Journal of Microelectromechanical Systems
, vol.13
, Issue.5
, pp. 870-879
-
-
Chaung, W.H.1
Luger, T.2
Fettig, R.K.3
Ghodssi, R.4
-
5
-
-
0034275647
-
In situ measurement of residual stresses in micromachined thin films using a specimen with composite-layered cantilevers
-
Y.H. Min, and Y.K. Kim, "In Situ Measurement of Residual Stresses in Micromachined Thin films Using a Specimen with Composite-Layered Cantilevers," Journal of Micromechanics and Microengineering, Vol. 10, (2000), pp. 314-321.
-
(2000)
Journal of Micromechanics and Microengineering
, vol.10
, pp. 314-321
-
-
Min, Y.H.1
Kim, Y.K.2
-
6
-
-
0141482405
-
High-cycle fatigue of micron-scale polycrystalline silicon films: Fracture mechanics analyses of the role of silica/silicon interface
-
C.L. Muhlstein, and R.O. Ritchie, "High-Cycle Fatigue of Micron-Scale Polycrystalline Silicon Films: Fracture Mechanics Analyses of the Role of Silica/Silicon Interface," International Journal of Fracture, Vol. 119/120, (2003), pp. 449-474.
-
(2003)
International Journal of Fracture
, vol.119-120
, pp. 449-474
-
-
Muhlstein, C.L.1
Ritchie, R.O.2
-
7
-
-
10844289008
-
Thermal fatigue testing of thin metal films
-
R. Mönig, R.R. Keller, and C.A. Volkert, "Thermal Fatigue Testing of Thin Metal Films," Review of Scientific Instruments, Vol. 75, No. 11, (2004), pp. 4997-5004.
-
(2004)
Review of Scientific Instruments
, vol.75
, Issue.11
, pp. 4997-5004
-
-
Mönig, R.1
Keller, R.R.2
Volkert, C.A.3
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