-
2
-
-
3042704459
-
Horizontal Hall effect sensor with high maximum absolute sensitivity
-
Kammerer, J.-B., Hébrard, L., Frick, V., Poure, P., & Braun, F. (2003). Horizontal Hall effect sensor with high maximum absolute sensitivity. IEEE Sensors Journal, 3(6), 700–707.
-
(2003)
IEEE Sensors Journal
, vol.3
, Issue.6
, pp. 700-707
-
-
Kammerer, J.-B.1
Hébrard, L.2
Frick, V.3
Poure, P.4
Braun, F.5
-
3
-
-
0035811406
-
Integrated Hall-effect magnetic sensors
-
Popovic, R., Randjelovic, Z., & Manic, D. (2001). Integrated Hall-effect magnetic sensors. Sensors and Actuators A, 91(2), 46–50.
-
(2001)
Sensors and Actuators A
, vol.91
, Issue.2
, pp. 46-50
-
-
Popovic, R.1
Randjelovic, Z.2
Manic, D.3
-
4
-
-
27944458474
-
CMOS quad spinning-current Hall sensor system for compass application
-
van der Meer, J., Riedijk, F., de Jong, P., van Kampen, E., Meekel, M., & Huijsing, J. (2004). CMOS quad spinning-current Hall sensor system for compass application. In Proceedings of the 2004 IEEE Sensors, pp. 1434–1437.
-
(2004)
Proceedings of the 2004 IEEE Sensors
, pp. 1434-1437
-
-
Van Der Meer, J.1
Riedijk, F.2
De Jong, P.3
Van Kampen, E.4
Meekel, M.5
Huijsing, J.6
-
5
-
-
52449126674
-
3D Hall probe integrated in 0.35 lm CMOS technology for magnetic field pulses measurements
-
Pascal, J., Hébrard, L., Frick, V., & Blondé, J. (2008). 3D Hall probe integrated in 0.35 lm CMOS technology for magnetic field pulses measurements. In Joint 6th IEEE NEWCAS and TAISA Conference (NEWCAS 2008), Montral (Canada), pp. 97–100, June 22–25, 2008.
-
(2008)
Joint 6Th IEEE NEWCAS and TAISA Conference (NEWCAS 2008)
, pp. 97-100
-
-
Pascal, J.1
Hébrard, L.2
Frick, V.3
Blondé, J.4
-
6
-
-
51449092028
-
CMOS integrated system for magnetic field monitoring and gradient measurement in MRI environment
-
Frick, V., Pascal, J., Hébrard, L., Blondé, J.-P., & Felblinger, J. (2007). CMOS integrated system for magnetic field monitoring and gradient measurement in MRI environment. In Proceedings of the 50th Midwest symposium on circuits and systems, MWCAS 2007, pp. 69–72.
-
(2007)
Proceedings of the 50Th Midwest Symposium on Circuits and Systems, MWCAS 2007
, pp. 69-72
-
-
Frick, V.1
Pascal, J.2
Hébrard, L.3
Blondé, J.-P.4
Felblinger, J.5
-
7
-
-
3142661738
-
3D simulation of cross-shaped Hall sensor and its equivalent circuit model
-
Jovanovic, E., Pesic, T., & Pantic, D. (2004). 3D simulation of cross-shaped Hall sensor and its equivalent circuit model. In Proceedings of the 24th international conference on microelectronics, pp. 235–238.
-
(2004)
Proceedings of the 24Th International Conference on Microelectronics
, pp. 235-238
-
-
Jovanovic, E.1
Pesic, T.2
Pantic, D.3
-
8
-
-
56749156886
-
Behavioral model of magnetic sensors for SPICE simulations
-
Rossini, A., Borghetti, F., Malcovati, P., & Maloberti, F. (2005). Behavioral model of magnetic sensors for SPICE simulations. In Proceedings of the 12th IEEE international conference on electronic, circuits and systems (ICECS 2005), pp. 1–4.
-
(2005)
Proceedings of the 12Th IEEE International Conference on Electronic, Circuits and Systems (ICECS 2005)
, pp. 1-4
-
-
Rossini, A.1
Borghetti, F.2
Malcovati, P.3
Maloberti, F.4
-
9
-
-
27944502164
-
Limits of offset cancellation by the principle of spinning current Hall probe
-
Udo, A. (2004). Limits of offset cancellation by the principle of spinning current Hall probe. Proc. IEEE Sensor, 24, 1117–1120.
-
(2004)
Proc. IEEE Sensor
, vol.24
, pp. 1117-1120
-
-
Udo, A.1
-
11
-
-
44849135869
-
Horizontal HALL devices: A lumped-circuit model for EDA simulators
-
Dimitropoulos, P., Drljaca, P., Popovic, R., & Chatzinikolaou, P. (2008). Horizontal HALL devices: A lumped-circuit model for EDA simulators. Sensors and Actuators A, 145–146, 161–175.
-
(2008)
Sensors and Actuators A
, pp. 161-175
-
-
Dimitropoulos, P.1
Drljaca, P.2
Popovic, R.3
Chatzinikolaou, P.4
-
12
-
-
78349283142
-
An improved compact model of cross-shaped horizontal CMOS-integrated Hall-effect sensor
-
Madec, M., Kammerer, J. B., & Hébrard, L. (2010). An improved compact model of cross-shaped horizontal CMOS-integrated Hall-effect sensor. In 8th IEEE international northeast workshop on circuits and systems conference (NEWCAS 2010), Montreal (Canada), pp. 397–400, June 20–23, 2010.
-
(2010)
8Th IEEE International Northeast Workshop on Circuits and Systems Conference (NEWCAS 2010)
, pp. 397-400
-
-
Madec, M.1
Kammerer, J.B.2
Hébrard, L.3
-
13
-
-
80055048669
-
An accurate compact model for CMOS cross-shaped Hall effect sensors
-
Madec, M., Kammerer, J. B., Hébrard, L., & Lallement, C. (2011). An accurate compact model for CMOS cross-shaped Hall effect sensors. Sensors and Actuators A, 171, 69–78.
-
(2011)
Sensors and Actuators A
, vol.171
, pp. 69-78
-
-
Madec, M.1
Kammerer, J.B.2
Hébrard, L.3
Lallement, C.4
-
14
-
-
0031145708
-
Compensation of the temperature-dependent offset drift of a Hall sensor
-
Blanchard, H., Iseli, D. R., & Popovic, R. S. (1997). Compensation of the temperature-dependent offset drift of a Hall sensor. Sensors and Actuators A, 60, 10–13.
-
(1997)
Sensors and Actuators A
, vol.60
, pp. 10-13
-
-
Blanchard, H.1
Iseli, D.R.2
Popovic, R.S.3
-
16
-
-
0033319396
-
Influence of mechanical stress on the offset voltage of Hall devices operated with spinning current method
-
Steiner, R., Maier, C., Mayer, M., Bellekom, S., & Baltes, H. (1999). Influence of mechanical stress on the offset voltage of Hall devices operated with spinning current method. Journal of Microelectromechanical Systems, 8(4), 466–472.
-
(1999)
Journal of Microelectromechanical Systems
, vol.8
, Issue.4
, pp. 466-472
-
-
Steiner, R.1
Maier, C.2
Mayer, M.3
Bellekom, S.4
Baltes, H.5
-
17
-
-
0025699013
-
A low offset spinning-current Hall plate
-
Munter, P. J. (1990). A low offset spinning-current Hall plate. Sensors and Actuators A, 22, 743–746.
-
(1990)
Sensors and Actuators A
, vol.22
, pp. 743-746
-
-
Munter, P.J.1
-
18
-
-
84856875024
-
Analysis of the efficiency of spinning-current techniques thru compact modeling
-
Madec, M., Kammerer, J. B., Hébrard, L., & Lallement, C. (2011). Analysis of the efficiency of spinning-current techniques thru compact modeling. In Proceedings of IEEE sensors 2011, Limerick, Ireland, pp. 542–545, October 28–31, 2011.
-
(2011)
Proceedings of IEEE Sensors 2011
, pp. 542-545
-
-
Madec, M.1
Kammerer, J.B.2
Hébrard, L.3
Lallement, C.4
-
21
-
-
0024911806
-
Accounting for incomplete ionization in modeling silicon based semiconductor devices
-
Cole, D. C., & Johnson, J. B. (1989). Accounting for incomplete ionization in modeling silicon based semiconductor devices. In Proceedings of the workshop on low temperature semiconductor electronics, Burlington, VT, USA, pp. 73–77.
-
(1989)
In Proceedings of the Workshop on Low Temperature Semiconductor Electronics
, pp. 73-77
-
-
Cole, D.C.1
Johnson, J.B.2
-
22
-
-
0027656349
-
77 K versus 300 K operation: The quasi-saturation behavior of a DMOS device and its fully analytical model
-
Liu, C. M., Lou, K. H., & Kuo, J. B. (1993). 77 K versus 300 K operation: the quasi-saturation behavior of a DMOS device and its fully analytical model. IEEE Transactions on Electron Devices, 40(9), 1636–1644.
-
(1993)
IEEE Transactions on Electron Devices
, vol.40
, Issue.9
, pp. 1636-1644
-
-
Liu, C.M.1
Lou, K.H.2
Kuo, J.B.3
|