CMOS integrated system for magnetic field monitoring and gradient measurement in MRI environment

Midwest Symposium on Circuits and Systems

Volumn , Issue , 2007, Pages 69-72

  Frick, Vincent ^a   Pascal, Joris ^a   Hébrard, Luc ^a   Blondé, Jean Philippe ^a   Felblinger, Jacques ^b  

^a CNRS   (France)

^b INSERM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; INTEGRATED CONTROL; INTEGRATED OPTICS; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; NETWORKS (CIRCUITS);

GRADIENT MEASUREMENTS; INTEGRATED SYSTEMS; STATIC FIELDS;

MAGNETIC MATERIALS;

EID: 51449092028     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2007.4488543     Document Type: Conference Paper

References (5)

1. R.S. Popovic, Hall effect devices, 2nd edition, Institute of Physics, 2004.
2. th IEEE Intl. Conf. on Electronics, Circuits and Systems, pp. 310-313, December 2006.
3. V. Frick, L. Hébrard, P. Poure, F. Braun, "CMOS Microsystem Front-End for MicroTesla Resolution Magnetic Field Measurement", AICSP J., Special issue on ICECS 2001, Kluwer Academic Publishers, vol. 36, pp. 165-174, 2003.
4. nd IEEE Industrial Electronics Society Conf. pp. 3090-3094, November 2006.
5. V. Frick, L. Hébrard, P. Poure, F. Anstotz, F. Braun., "CMOS microsystem for AC current measurement with galvanic isolation", IEEE Sensor Journal, vol. 3, pp. 752-760, 3, 2003.