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2008 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA

Volumn , Issue , 2008, Pages 97-100

3D Hall probe integrated in 0.35 μm CMOS technology for magnetic field pulses measurements

(4) Pascal, Joris a Hébrard, Luc a Frick, Vincent a Blonde, Jean Philippe a

a Faculté de Médecine (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; ELECTRIC CURRENTS; GALVANOMAGNETIC EFFECTS; HALL EFFECT; HALL EFFECT DEVICES; MAGNETIC FIELD EFFECTS; MAGNETIC FIELD MEASUREMENT; MAGNETIC FIELDS; MAGNETISM; STANDARDS; TECHNOLOGY;

3-DIMENSIONAL; CMOS TECHNOLOGIES; FREQUENCY RANGING; HALL DEVICES; HALL PROBES; HALL VOLTAGES; HALL-EFFECT SENSORS; LOW COSTS; MAGNETIC PULSES; MAGNETIC-FIELD PULSES; POST PROCESSING; POWER CONSUMPTION; SPATIAL RESOLUTION SR); STATIC FIELDS; STATIC MAGNETIC FIELD;

MAGNETIC MATERIALS;

EID: 52449126674 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/NEWCAS.2008.4606330 Document Type: Conference Paper

Times cited : (23)

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