Analysis of the efficiency of spinning-current techniques thru compact modeling

Proceedings of IEEE Sensors

Volumn , Issue , 2011, Pages 542-545

  Madec, Morgan ^a   Kammerer, Jean Baptiste ^a   Hébrard, Luc ^a   Lallement, Christophe ^a  

^a Faculté de Médecine   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS TECHNOLOGY; COMPACT MODEL; COMPACT MODELING; DESIGN PROCESS; MONTE CARLO ANALYSIS; OFFSET CANCELLATION; SC TECHNIQUE;

CMOS INTEGRATED CIRCUITS;

SENSORS;

EID: 84856875024     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2011.6127318     Document Type: Conference Paper

References (7)

1. E. Ramsden, Hall-effect sensors: theory and applications, ed. Newnes, New York, 2006.
2. J.-B. Kammerer, L. Hébrard, V. Frick, P. Poure and F. Braun, "Hall effect sensor with high maximum absolute sensitivity," IEEE Sensors Journal, vol. 3(6), pp. 700-707, 2003.
3. J. Pascal, L. Hébrard, V. Frick, J.-P. Blondé, "3D Hall probe integrated in 0.35μm CMOS technology for magnetic field pulses measurement,"IEEE NEWCAS and TAISA Conf., Montréal (Canada), 2008.
4. M. Madec, J.-B. Kammerer, L. Hébrard, C. Lallement, "An Accurate Compact Model for CMOS Cross-Shaped Hall Effect Sensors,"Sensors and Actuators A, 2011 (under press).
5. P. J. Munter, "A low offset spinning-current Hall plate," Sensors and Actuators A, vol. 22, pp. 743-746, 1990.
6. A. Udo, "Limits of offset cancellation by the principle of spinning current Hall probe," Proc. IEEE Sensors, 2004.
7. R. Popovic, Hall-effect devices, Institute of Physics, 2004.