Electrical and optical properties of sputtered amorphous vanadium oxide thin films

Journal of Applied Physics

Volumn 111, Issue 7, 2012, Pages

  Podraza, N J ^a   Gauntt, B D ^b   Motyka, M A ^c   Dickey, E C ^d   Horn, M W ^c  

^a UNIVERSITY OF TOLEDO   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c The Pennsylvania State University   (United States)

^d North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS COMPONENT; COMPLEX DIELECTRIC FUNCTIONS; CURRENT-VOLTAGE MEASUREMENTS; ELECTRICAL AND OPTICAL PROPERTIES; FACE-CENTERED CUBIC; FILM RESISTIVITY; HIGH TEMPERATURE; IMAGING DEVICE; METAL-TO-SEMICONDUCTOR TRANSITION; MICROSTRUCTURAL VARIATION; NANOCRYSTALLINES; OXYGEN CONTENT; POLYCRYSTALLINE; PULSED DC; ROOM TEMPERATURE; TEMPERATURE DEPENDENT; THERMAL ACTIVATION ENERGIES; THIN FILM MATERIAL; UNCOOLED INFRARED; VANADIUM DIOXIDE; VANADIUM MONOXIDES; VANADIUM OXIDE THIN FILMS; VANADIUM OXIDES;

ACTIVATION ENERGY; AMORPHOUS MATERIALS; COMPOSITE FILMS; CRYSTALLITES; ELECTRONIC PROPERTIES; GRAIN BOUNDARIES; INFRARED IMAGING; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; OXIDE MINERALS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VANADIUM COMPOUNDS;

ELECTRIC PROPERTIES;

EID: 84861747748     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3702451     Document Type: Conference Paper

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