Characterization of CBD grown ZnO films with high c-axis orientation

Materials Chemistry and Physics

Volumn 134, Issue 2-3, 2012, Pages 1036-1041

  Kahraman, S ^a   Bayansal, F ^a   Cetinkara H A ^a   Cakmak H M ^a   Guder H S ^a  

^a MUSTAFA KEMAL UNIVERSITY   (Turkey)

Author keywords

Chemical synthesis; Electrical properties; Nanostructures; Precipitation

Indexed keywords

C-AXIS ORIENTATIONS; CHEMICAL SYNTHESIS; CHEMICAL-BATH DEPOSITION; DEPOSITION TIME; DISLOCATION DENSITIES; ELECTRICAL RESISTIVITY; FOUR-POINT PROBE METHOD; GLASS SUBSTRATES; GRAIN SIZE; HEXAGONAL WURTZITE STRUCTURE; LATTICE STRUCTURES; MICRO-STRAIN; SEED LAYER; SEM IMAGE; SUBSTRATE SURFACE; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; TEMPERATURE CHARACTERISTIC; TEMPERATURE RANGE; TEXTURE COEFFICIENT; XRD PATTERNS; ZNO FILMS;

ACTIVATION ENERGY; ADSORPTION; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; NANORODS; NANOSTRUCTURES; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SUBSTRATES; X RAY DIFFRACTION; ZINC SULFIDE;

METALLIC FILMS;

EID: 84861531589     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2012.03.108     Document Type: Article

References (45)

1. M.Y. Yen, C.W. Chiu, C.H. Hsia, F.R. Chen, J.J. Kai, C.Y. Lee, and H.T. Chiu Adv. Mater. 15 2003 235
2. J.B. Chang, J.Z. Liu, P.X. Yan, L.F. Bai, Z.J. Yan, X.M. Yuan, and Q. Yang Mater. Lett. 60 2006 2125
3. J.T. Chen, F. Zhang, J. Wang, G.A. Zhang, B.B. Miao, X.Y. Fan, D. Yan, and P.X. Yan J. Alloys Compd. 454 2008 268
4. Z.W. Liu, and Y. Bando Adv. Mater. 15 2003 303
5. W. Wang, Z. Liu, Y. Liu, C. Xu, C. Zheng, and G. Wang Appl. Phys. A 76 2003 417
6. B. Yuan, X. Jun Zheng, Y. Chen, B. Yang, and T. Zhang Solid State Electronics 55 2011 49
7. E. Jang, J. Won, Y. Kim, Z. Cheng, and J. Choy J. Solid State Chem. 183 2010 1835
8. H. Morkoç, and Ü. Özgür Zinc Oxide, Fundamentals, Materials and Device Technology 2009 Wiley-VCH Weinheim
9. C. Klingshirn ChemPhysChem 12 2007 782
10. D.P. Norton, Y.W. Heo, M.P. Ivill, K. Ip, S.J. Pearton, M.F. Chisholm, and T. Steiner Mater. Today 7 2004 34
11. B. Ergin, E. Ketenci, and F. Atay Int. J. Hydrogen Energy 34 2009 5249
12. F. Favier, E.C. Walter, M.P. Zach, T. Benter, and R.M. Penner Science 293 2001 2227
13. M. Seol, H. Kim, W. Kim, and K. Yong Electrochem. Comm. 12 2010 1416
14. N.H. Al-Hardan, M.J. Abdullah, and A. Abdul Aziz Int. J. Hydrogen Energy 35 2010 4428
15. J.-W. Hoon, K.-Y. Chan, J. Krishnasamy, T.-Y. Tou, and D. Knipp Appl. Surface Science 257 2011 2508
16. M. Ju, Q. Li, and E. Wang Mater. Lett. 65 2010 507
17. M. Fragala, Y. Aleeva, and G. Malandrino Superlattices and Microstructures 48 2010 408
18. S.A. Vanalakar, R.C. Pawar, M.P. Suryawanshi, S.S. Mali, D.S. Dalavi, A.V. Moholkar, K.U. Sim, Y.B. Kown, J.H. Kim, and P.S. Patil Material Lett. 65 2011 548
19. F. Bayansal, S. Kahraman, G. Çankaya, H.A. Çetinkara, H.S. Güder, and H.M. Çakmak J. Alloys Comp. 509 2011 2094
20. X.D. Gao, X.M. Li, and W.D. Yu Mater. Res. Bull. 40 2005 1104
21. C. Zhang J. Phys.Chem.Solids 71 2010 364
22. P. Suresh Kumar, A. Dhayal Raj, D. Mangalaraj, and D. Nataraj Applied Surface Science 255 2008 2382
23. P. Suresh Kumar, A. Dhayal Raj, D. Mangalaraj, D. Nataraj, N. Ponpandian, Lin Li, and G. Chabrol App. Surface Science 257 2011 6678
24. R. Saravana Kumar, R. Sathyamoorthy, P. Matheswaran, P. Sudhagar, and Yong Soo Kang J. Alloys Compounds 506 2010 351
25. T. Pauporte, and D. Lincot Electrochim. Acta 45 2000 3345
26. G. Hodes Chemical Solution Deposition of Semiconductor Films 2005 Marcel Dekker, Inc. New York
27. V.R. Shinde, C.D. Lokhande, R.S. Mane, and S. Han Appl. Surf. Sci. 245 2005 407
28. Z.Q. Xu, H. Deng, Y. Li, Q.H. Guo, and Y.R. Li Mater. Res. Bull. 41 2006 354
29. R.J. Hong, K. Helming, X. Jiang, and B. Szyszka Appl. Surf. Sci. 226 2004 378
30. H. Deng, J.J. Russell, R.N. Lamb, B. Jiang, Y. Li, and X.Y. Zhou Thin Solid Films 458 2004 43
31. Powder Diffraction File 36-1451 for Hexagonal Zinc Oxide 1997 JCPDS-International Center for Diffraction Data
32. A. Van Der Drift Evolutionary selection Philips Res. Rep. 22 1967 267
33. G. Knuyt, C. Quaeyhaegens, J.D. Haen, and L.M. Stals Phys. Status Solidi B 195 1996 179
34. P.B. Barna, and M. Adamik Thin Solid Films 317 1998 27
35. N. Kakati, S.H. Jee, S.H. Kim, J.Y. Oh, and Y.S. Yoon Thin Solid Films 519 2010 494
36. V. Pecharsky, and P. Zavalij Fundamentals of Powder Diffraction and Structural Characterization of Materials 2005 Springer New York
37. A. Suresh, K. Chatterjee, V. Sharma, S. Ganguly, K. Kargupta, and D. Banerjee J. Electronic Matter 38 2009 3
38. C.S. Barret, and C.S. Massalski Structure of Metals 1980 Pergamon Press Oxford
39. G.G. Rusu, A.P. Rambu, V.E. Buta, M. Dobromir, D. Luca, and M. Rusu Mater. Chem. and Phys. 123 2010 314
40. A.A. Dakhel, and F.Z. Henari Cryst. Res. Technol. 38 2003 979
41. R. Cebulla, R. Wendt, and K. Ellmer J. Appl. Phys. 83 1998 1087
42. U. Ozgur, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, and H. Morkoc J. Appl. Phys. 98 2005 041301
43. J. Jeorge, and M.K. Radhakrishanan Solid State Commun. 33 1980 243
44. J. Tellier, D. Kuščer, B. Malič, J. Cilenšek, M. Škarabot, J. Kovač, G. Gonçalves, I. Muševič, and M. Kosec Thin Solid Films 518 2010 5134
45. P.F. Carcia, R.S. McLean, M.H. Reilly, and G. Nunes Jr. Appl. Phys. Lett. 82 2003 1117