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Volumn 79, Issue 12, 2001, Pages 1888-1890
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Squeezing out hidden force information from scanning force microscopes
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035903417
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1405430 Document Type: Article |
Times cited : (19)
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References (16)
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