Bending effects of ZnO nanorods metal-semiconductor-metal photodetectors on flexible polyimide substrate

Nanoscale Research Letters

Volumn 7, Issue , 2012, Pages

  Chen, Tse Pu ^a   Young, Sheng Joue ^b   Chang, Shoou Jinn ^a   Hsiao, Chih Hung ^a   Hsu, Yu Jung ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL FORMOSA UNIVERSITY   (Taiwan)

Author keywords

Flexible; MSM; Nanorod; Photodetector; ZnO

Indexed keywords

BENDING EFFECT; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FLEXIBLE; FLEXIBLE POLYIMIDE; FLEXIBLE POLYIMIDE SUBSTRATE; FLEXIBLE SUBSTRATE; HEXAGONAL STRUCTURES; IV CHARACTERISTICS; METAL SEMICONDUCTOR METAL PHOTODETECTOR; MSM; RADIUS OF CURVATURE; REJECTION RATIOS; RESPONSE MEASUREMENT; SCHOTTKY BARRIER HEIGHTS; SEMICONDUCTOR METALS; WURTZITES; ZNO; ZNO NANOROD;

PHOTODETECTORS; POLYIMIDES; SUBSTRATES; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

NANORODS;

EID: 84860659606     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-7-214     Document Type: Article

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