Feedback-induced instability in tapping mode atomic force microscopy: Theory and experiment

Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 467, Issue 2130, 2011, Pages 1801-1822

  Payton, O ^a   Champneys, A R ^a   Homer, M E ^a   Picco, L ^a   Miles, M J ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

Atomic force microscope; Control; Feedback; Nonlinear; Oscillation; Tapping mode

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; BEATING EFFECTS; CONTROL LOOP; DRIVING FREQUENCIES; HIGH GAIN; INTEGRAL CONTROL; MENISCUS FORCE; NONLINEAR; OSCILLATION; QUALITATIVE FEATURES; SURFACE INTERACTIONS; TAPPING MODE; TAPPING-MODE ATOMIC FORCE MICROSCOPY; VAN DER WAALS;

ATOMIC FORCE MICROSCOPY; EXPERIMENTS; VAN DER WAALS FORCES;

MATHEMATICAL MODELS;

EID: 79958255920     PISSN: 13645021     EISSN: 14712946     Source Type: Journal    
DOI: 10.1098/rspa.2010.0451     Document Type: Conference Paper

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