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Volumn 66, Issue 11, 2012, Pages 907-910

Atom probe crystallography: Atomic-scale 3-D orientation mapping

Author keywords

Atom probe tomography; Nanocrystalline materials; Nanostructure; Orientation imaging microscopy (OIM); Texture

Indexed keywords

3-D MAPPING; ATOM PROBE; ATOM PROBE TOMOGRAPHY; ATOMIC SCALE; ATOMIC SCALE STRUCTURES; CRYSTALLOGRAPHIC DIRECTIONS; CRYSTALLOGRAPHIC INFORMATION; GRAIN ORIENTATION; LENGTH SCALE; NANOMETRES; ORIENTATION IMAGING MICROSCOPY; ORIENTATION MAPPING;

EID: 84859782568     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2012.02.022     Document Type: Article
Times cited : (58)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.