Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation

Ultramicroscopy

Volumn 111, Issue 6, 2011, Pages 458-463

  Yao, L ^a   Moody, M P ^a   Cairney, J M ^a   Haley, Daniel ^a,b   Ceguerra, A V ^a   Zhu, C ^a   Ringer, S P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

3D Hough transformation; Atom probe microscopy; Tomographic reconstruction; Tomography

Indexed keywords

ATOMS; CRYSTAL STRUCTURE; GRAIN BOUNDARIES; METADATA; PROBES; TOMOGRAPHY;

ATOM PROBE MICROSCOPIES; CRYSTAL GEOMETRY; DISCONTINUOUS PLANE; HOUGH TRANSFORMATION; QUANTITATIVE DETERMINATIONS; SEMICONDUCTING MATERIALS; SPATIAL RESOLUTION; TOMOGRAPHIC RECONSTRUCTION;

CRYSTAL ATOMIC STRUCTURE;

ARTICLE; ATOM PROBE MICROSCOPY; AUTOMATION; CHEMICAL ANALYSIS; CONTROLLED STUDY; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DESORPTION; GEOMETRY; MICROSCOPY; OPTICAL RESOLUTION; PROCESS OPTIMIZATION; QUANTITATIVE ANALYSIS; SEMICONDUCTOR; STRUCTURE ANALYSIS; THREE DIMENSIONAL HOUGH TRANSFORMATION;

EID: 80052517424     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.11.018     Document Type: Article

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