Observation of atomic planes in 3DAP analysis

Ultramicroscopy

Volumn 73, Issue 1-4, 1998, Pages 261-266

  Warren, P J ^a   Cerezo, A ^a   Smith, G D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CRYSTAL LATTICES; CRYSTALLOGRAPHY; GRAIN BOUNDARIES; IMAGE ANALYSIS; PROBES; TUNGSTEN;

ATOMIC PLANES; THREE DIMENSIONAL ATOM PROBE;

OPTICAL MICROSCOPY;

CONFERENCE PAPER; IMAGE PROCESSING; IMAGE RECONSTRUCTION; THREE DIMENSIONAL IMAGING;

EID: 0032102042     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00165-4     Document Type: Conference Paper

References (8)

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3. Cerezo A., Godfrey T.J., Hyde J.M., Sijbrandij S.J., Smith G.D.W. Appl. Surf. Sci. 76/77:1994;374.
4. T.F. Kelly, H.-O. Andrén, D. Blavette, P.P. Camus, A. Cerezo, A. Menand, M.K. Miller, G.D.W. Smith, Appl. Surf. Sci. 76/77 (1994) xxi-xxvi.
5. Waugh A.R., Boyes E.D., Southon M.J. Surf. Sci. 61:1976;109.
6. Camus P.P., Larson D.J., Kelly T.F. Appl. Surf. Sci. 87/88:1995;305.
7. Sijbrandij S.J., Cerezo A., Godfrey T.J., Smith G.D.W. Appl. Surf. Sci. 94/95:1996;428.
8. Hyde J.M., Cerezo A., Setna R.P., Warren P.J., Smith G.D.W. Appl. Surf. Sci. 76/77:1994;382.