Evolution of microstructure and crack pattern in NiO thin films under 200MeV Au ion irradiation

Radiation Physics and Chemistry

Volumn 81, Issue 6, 2012, Pages 647-651

  Mallick, P ^a,e   Agarwal, D C ^b   Rath, Chandana ^c   Behera, D ^d   Avasthi, D K ^b   Kanjilal, D ^b   Mishra, N C ^e  

^a Maharaja Sriram Chandra Bhanja Deo University   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c BANARAS HINDU UNIVERSITY   (India)

^d NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^e UTKAL UNIVERSITY   (India)

Author keywords

Electronic excitation; Ion irradiation; Nanoparticles; NiO; Thermal spike model

Indexed keywords

COULOMB EXPLOSION; CRACK PATTERNS; ELECTRON BEAM EVAPORATION METHODS; ELECTRONIC EXCITATION; FCC STRUCTURES; FILM SURFACES; FLUENCES; ION FLUENCES; ION PATHS; ION TRACK; NIO; NIO THIN FILM; PRISTINE FILMS; SI (100) SUBSTRATE; SINTERED FILMS; THERMAL SPIKE MODEL;

ELECTRON BEAMS; FRACTAL DIMENSION; ION BOMBARDMENT; IRRADIATION; MICROSTRUCTURAL EVOLUTION; NANOPARTICLES; SINTERING; THIN FILMS;

IONS;

METAL OXIDE; NICKEL MONOXIDE; UNCLASSIFIED DRUG;

ARTICLE; COMPRESSION; CRACK PATTERN; ELECTRON BEAM EVAPORATION; EVAPORATION; ION FLUENCE; MELTING POINT; MICROSTRUCTURE; PHASE TRANSITION; PHYSICAL PARAMETERS; RADIATION; SILVER ION IRRADIATION; SURFACE PROPERTY; THERMAL SPIKE MODEL; THERMODYNAMICS;

EID: 84859721003     PISSN: 0969806X     EISSN: 18790895     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2012.02.032     Document Type: Article

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