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Volumn 106, Issue 2, 2009, Pages

Swift heavy ion induced structural changes in CdS thin films possessing different microstructures: A comparative study

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN FILMS; CDS; CDS THIN FILMS; COMPARATIVE STUDIES; COMPRESSIVE STRAIN; CRYSTALLINE QUALITY; DEFECT ANNEALING; DEFECT CREATION; ENERGY RELAXATION PROCESS; EVAPORATED FILMS; FLUENCES; HEXAGONAL PHASE; IN-BAND; LINE SHAPE; LONGITUDINAL OPTICAL PHONONS; OPTICAL ABSORPTION; OPTICAL ABSORPTION EDGE; PELLETRON; PL INTENSITY; POLYCRYSTALLINE THIN FILM; RAMAN SPECTRA; SPRAY-DEPOSITED; STRUCTURAL CHANGE; SWIFT HEAVY IONS; THIN FILM MICROSTRUCTURES; WAVE NUMBERS; X- RAY DIFFRACTION;

EID: 68249155009     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3173180     Document Type: Article
Times cited : (44)

References (46)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.