SHI induced modification of ZnO thin film: Optical and structural studies

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 244, Issue 1, 2006, Pages 136-140

  Agarwal, D C ^a   Kumar, Amit ^b   Khan, S A ^b   Kabiraj, D ^b   Singh, F ^b   Tripathi, A ^b   Pivin, J C ^c   Chauhan, R S ^a   Avasthi, D K ^b  

^a R B S COLLEGE   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

FTIR; Ion irradiation; Photoluminescence; UV Vis spectroscopy; X ray diffraction; ZnO thin film

Indexed keywords

FLUENCES; ION IRRADIATION; UV-VIS SPECTROSCOPY; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IONS; IRRADIATION; PHOTOLUMINESCENCE; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; ZINC OXIDE;

THIN FILMS;

EID: 33846330441     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.11.077     Document Type: Conference Paper

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