Scanning probe microscopy investigation of nanostructured surfaces induced by swift heavy ions

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 27, Issue 2, 2009, Pages 944-947

  Akcöltekin, Sevilay ^a   Akcöltekin, Ender ^a   Schleberger, Marika ^a   Lebius, Henning ^b  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b Direction de la Recherche Fondamentale   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE OF INCIDENCES; ANGLE RELATIONS; ATOMIC FORCES; COMPARATIVE STUDIES; GRAZING ANGLE OF INCIDENCES; HIGHLY ORIENTED PYROLYTIC GRAPHITES; ION BEAM ENERGIES; MATERIAL SURFACES; NANO-METER SCALE; NANO-SIZED; NANO-STRUCTURED SURFACES; NANODOTS; SCANNING PROBES; SWIFT HEAVY IONS; TARGET SURFACES; TRACK LENGTHS;

BUILDING MATERIALS; GRAPHITE; HEAVY IONS; OZONE WATER TREATMENT; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

SURFACES;

EID: 64549116400     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3054199     Document Type: Article

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