Drift estimation for single marker switching based imaging schemes

Optics Express

Volumn 20, Issue 7, 2012, Pages 7274-7289

  Geisler, Claudia ^a,c   Hotz, Thomas ^b   Schönle, Andreas ^c   Hell, Stefan W ^c   Munk, Axel ^b,c   Egner, Alexander ^a  

^a LASER LABORATORIUM GÖTTINGEN E V   (Germany)

^b UNIVERSITY OF GÖTTINGEN   (Germany)

^c MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS;

DATA-DRIVEN; DIFFRACTION BARRIER; DRIFT ANALYSIS; DRIFT CORRECTION; FLUORESCENCE IMAGING; IMAGING SCHEMES; LIMITING FACTORS; MECHANICAL INSTABILITIES; MODEL FREE; NANOSCOPES; PARAMETER CHOICE; QUALITY CHECKS; REGISTRATION METHODS; SPATIAL RESOLUTION; SUPER RESOLUTION; TRADE OFF;

OPTICS;

ARTICLE; ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; FIDUCIAL MARKER; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ARTIFACTS; FIDUCIAL MARKERS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

EID: 84859410908     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.007274     Document Type: Article

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