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Volumn 19, Issue 16, 2011, Pages 15009-15019

Sample drift correction in 3D fluorescence photoactivation localization microscopy

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE MICROSCOPY; STOCHASTIC SYSTEMS;

EID: 79961056134     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.015009     Document Type: Article
Times cited : (148)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.