Far-field fluorescence microscopy beyond the diffraction limit

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 16, Issue 4, 1999, Pages 909-915

  van Oijen, A M ^a   Kohler J ^a   Schmidt, J ^a   Muller M ^b   Brakenhoff, G J ^b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 35848970592     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.16.000909     Document Type: Article

References (18)

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