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Volumn 50, Issue 9, 2012, Pages 631-641

In situ film characterization of thermally treated microstructured conducting polymer films

Author keywords

conducting polymers; crystallization; GISAXS; microstructure; thermal annealing; thin film

Indexed keywords

CHANNEL HEIGHT; CHANNEL STRUCTURES; CHANNEL WIDTHS; FILM CHARACTERIZATIONS; GISAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; IMAGING ELLIPSOMETRY; IN-SITU; LOW COST FABRICATION; MESOSCOPICS; MOLECULAR REARRANGEMENT; POLYMER CONCENTRATIONS; POLYMER FLOWS; POLYMERIC STRUCTURES; THERMAL-ANNEALING;

EID: 84859150390     PISSN: 08876266     EISSN: 10990488     Source Type: Journal    
DOI: 10.1002/polb.23048     Document Type: Article
Times cited : (26)

References (51)
  • 43
    • 4444377516 scopus 로고
    • Yoneda, Y., Phys. Rev. 1963, 131, 2010-2013.
    • (1963) Phys. Rev. , vol.131 , pp. 2010-2013
    • Yoneda, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.