Influence of film thickness on the phase separation mechanism in ultrathin conducting polymer blend films

Journal of Physical Chemistry B

Volumn 115, Issue 12, 2011, Pages 2899-2909

  Meier, Robert ^a   Ruderer, Matthias A ^a   Diethert, Alexander ^a   Kaune, Gunar ^b   Körstgens, Volker ^a   Roth, Stephan V ^c   Müller Buschbaum, Peter ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^c DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BLENDING; CONDUCTING POLYMERS; CONDUCTIVE FILMS; FILM THICKNESS; MORPHOLOGY; ORGANIC CONDUCTORS; PLASTIC COATINGS; POLYMER FILMS; ULTRATHIN FILMS; X RAY SCATTERING;

BLEND FILMS; BLENDING RATIO; FILM MORPHOLOGY; FLORY-HUGGINS THEORY; GRAZING INCIDENCE; HOMOPOLYMERS; LINEAR DEPENDENCE; MEH-PPV; METHOXY; PHASE SEPARATION BEHAVIOR; PHASE SEPARATION MECHANISM; PHENYLENEVINYLENE; POLY(N-VINYLCARBAZOLE); RODLIKE POLYMER; SOLID SUPPORTS; SPIN-COATING PROCESS; SUBSTRATE INTERFACE; THIN POLYMERS; ULTRA-THIN; ULTRASMALL-ANGLE X-RAY SCATTERINGS; UV/ VIS SPECTROSCOPY; X-RAY REFLECTIVITY MEASUREMENTS;

PHASE SEPARATION;

EID: 79953033221     PISSN: 15206106     EISSN: 15205207     Source Type: Journal    
DOI: 10.1021/jp200341u     Document Type: Article

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