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Volumn 11, Issue 10, 2010, Pages 2205-2208
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Structure of glancing incidence deposited TiO2 thin films as revealed by grazing incidence small-angle x-ray scattering
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Author keywords
GISAXS; GLAD; Nanostructures; Sensors; Thin films
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Indexed keywords
MORPHOLOGY;
NANOSTRUCTURES;
PHYSICAL VAPOR DEPOSITION;
SCANNING ELECTRON MICROSCOPY;
SENSORS;
TITANIUM DIOXIDE;
X RAY SCATTERING;
GI-SAXS;
GLAD;
GLANCING INCIDENCE;
GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING;
SCANNING ELECTRON MICROSCOPY IMAGE;
THICKNESS OF THE FILM;
TILTED GEOMETRY;
TIO2 THIN FILMS;
THIN FILMS;
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EID: 77954770113
PISSN: 14394235
EISSN: 14397641
Source Type: Journal
DOI: 10.1002/cphc.201000136 Document Type: Article |
Times cited : (32)
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References (14)
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