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Volumn 11, Issue 10, 2010, Pages 2205-2208

Structure of glancing incidence deposited TiO2 thin films as revealed by grazing incidence small-angle x-ray scattering

Author keywords

GISAXS; GLAD; Nanostructures; Sensors; Thin films

Indexed keywords

MORPHOLOGY; NANOSTRUCTURES; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SENSORS; TITANIUM DIOXIDE; X RAY SCATTERING;

EID: 77954770113     PISSN: 14394235     EISSN: 14397641     Source Type: Journal    
DOI: 10.1002/cphc.201000136     Document Type: Article
Times cited : (32)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.