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Volumn 110, Issue 11, 2011, Pages

Dielectrophoretic assembly and atomic force microscopy modification of reduced graphene oxide

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE APPROACH; ANDERSON LOCALIZATION; ATOMIC FORCE; DETERMINISTIC TECHNIQUE; DIELECTROPHORETIC; DIELECTROPHORETIC ASSEMBLY; ELECTRIC TRANSPORT MEASUREMENTS; ELECTRICAL PERFORMANCE; EXPERIMENTAL STUDIES; FORM LINES; GRAPHENE OXIDES; LINE DEFECTS; MECHANICAL CUTTING; REDUCED GRAPHENE OXIDES; SINGLE LAYER; THEORETICAL STUDY;

EID: 84858967395     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3665212     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.