|
Volumn 6, Issue SUPPL. 2, 2009, Pages
|
Volmer-Weber growth mode of InN quantum dots on GaN by MOVPE
|
Author keywords
[No Author keywords available]
|
Indexed keywords
A-DENSITY;
AVERAGE DIAMETER;
AVERAGE STRUCTURE;
CONSTANT RATIO;
EX-SITU ATOMIC FORCE MICROSCOPY;
GAN/SAPPHIRE;
GROWTH REGIME;
GROWTH TIME;
HEXAGONAL STRUCTURES;
IN-SITU;
INDIUM NITRIDE;
INN QUANTUM DOTS;
METAL-ORGANIC VAPOUR PHASE EPITAXY;
MOVPE;
QUANTUM DOT;
STABILISATION;
SUBMONOLAYER COVERAGE;
TRIMETHYLINDIUM;
V/III RATIO;
VOLMER-WEBER GROWTH MODE;
VOLMER-WEBER MODES;
WETTING LAYER;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
COALESCENCE;
DESORPTION;
GALLIUM NITRIDE;
MONOLAYERS;
SEMICONDUCTOR QUANTUM DOTS;
SPECTROSCOPIC ELLIPSOMETRY;
QUANTUM CHEMISTRY;
|
EID: 79251617763
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200880872 Document Type: Article |
Times cited : (19)
|
References (14)
|