Virtualized and flexible ECC for main memory

International Conference on Architectural Support for Programming Languages and Operating Systems - ASPLOS

Volumn , Issue , 2010, Pages 397-408

  Yoon, Doe Hyun ^a   Erez, Mattan ^a  

^a The University of Texas at Austin   (United States)

Author keywords

Error correction; Fault tolerance; Memory systems; Reliability

Indexed keywords

BASIC IDEA; CORRECT ERROR; DRAM CHIPS; ERROR PROTECTION; MAIN MEMORY; MEMORY SYSTEMS; NAMESPACES; PACKAGING TECHNOLOGIES; PHYSICAL MAPPING; POWER EFFICIENCY; POWER SAVINGS; REDUNDANT INFORMATIONS; SAVE ENERGY; SYSTEM COSTS; SYSTEM ENERGY; VIRTUAL MEMORY SYSTEMS;

CHIP SCALE PACKAGES; COMPUTER OPERATING SYSTEMS; COST REDUCTION; DYNAMIC RANDOM ACCESS STORAGE; ERROR CORRECTION; FAULT TOLERANCE; LINGUISTICS; QUALITY ASSURANCE;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 77952257218     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1736020.1736064     Document Type: Conference Paper

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