Field testing for cosmic ray soft errors in semiconductor memories

IBM Journal of Research and Development

Volumn 40, Issue 1, 1996, Pages 41-49

  O'Gorman, T J ^a   Ross, J M ^a   Taber, A H ^a   Ziegler, J F ^a   Muhlfeld, H P ^a   Montrose, C J ^a   Curtis, H W ^a   Walsh, J L ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; COMPUTER SIMULATION; COSMIC RAYS; ELEMENTARY PARTICLES; MEASUREMENTS; MICROPROCESSOR CHIPS; RADIATION; RADIATION EFFECTS; SEMICONDUCTOR STORAGE;

COSMIC RAY SOFT ERRORS; FIELD TESTING; IONIZING RADIATION; MEMORY CHIPS; SOFT ERROR RATE;

CODING ERRORS;

EID: 0029732376     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.401.0041     Document Type: Article

References (26)

1. D. C. Bossen and M. Y. Hsiao, "A System Solution to the Memory Soft Error Problem," IBM J. Res. Develop. 24, No. 3, 390-397 (May 1980).
2. T. C. May and M. H. Woods, "Alpha-Particle-Induced Soft Errors in Dynamic Memories," IEEE Trans. Electron Devices ED-26, 2 (1979).
3. D. S. Yaney, J. T. Nelson, and L. L. Vanskike, "Alpha Particle Tracks in Silicon and Their Effect on Dynamic MOS RAM Reliability," IEEE Trans. Electron Devices ED-26, No. 1, 10-16 (January 1979).
4. J. F. Ziegler and W. A. Lanford, "Effect of Cosmic Rays on Computer Memories," Science 206, 776-788 (November 16, 1979).
5. J. F. Ziegler, H. W. Curtis, H. P. Muhlfeld, C. J. Montrose, B. Chin, M. Nicewicz, C. A. Russell, W. Y. Wang, L. B. Freeman, P. Hosier, L. E. LaFave, J. L. Walsh, J. M. Orro, G. J. Unger, J. M. Ross, T. J. O'Gorman, B. Messina, T. D. Sullivan, A. J. Sykes, H. Yourke, T. A. Enger, V. Tolat, T. S. Scott, A. H. Taber, R. J. Sussman, W. A. Klein, and C. W. Wahaus, "IBM Experiments in Soft Fails in Computer Electronics (1978-1994)," IBM J. Res. Develop. 40, No. 1, 3-18 (1996, this issue).
6. H. H. K. Tang, "Nuclear Physics of Cosmic Ray Interaction with Semiconductor Materials: Particle-Induced Soft Errors from a Physicist's Perspective," IBM J. Res. Develop. 40, No. 1, 91-108 (1996, this issue).
7. G. A. Sai-Halasz, "Monte Carlo Modeling of the Transport of Ionizing Radiation Created Carriers in Integrated Circuits," IEEE Electron Device Lett. EDL-1, No. 10, 2111-2113 (October 1980).
8. G. A. Sai-Halasz and D. D. Tang, "Soft Error Rate in Static Bipolar RAMs," IEEE IEDM Tech. Digest 83, 344-346 (1983).
9. G. R. Srinivasan, H. K. Tang, and P. C. Murley, "Parameter-Free, Predictive Modeling of Single Event Upsets Due to Protons, Neutrons, and Pions in Terrestrial Cosmic Rays," IEEE Trans. Nucl. Sci. 41, 2063-2070 (1994).
10. G. R. Srinivasan, P. C. Murley, and H. H. K. Tang, "Accurate, Predictive Modeling of Soft Error Rate Due to Cosmic Rays and Chip Alpha Radiation," Proceedings of the 32nd Annual IEEE International Reliability Physics Symposium, April 1994, pp. 12-16.
11. G. R. Srinivasan, "Modeling the Cosmic-Ray-Induced Soft-Error Rate in Integrated Circuits: An Overview," IBM J. Res. Develop. 40, No. 1, 77-89 (1996, this issue).
12. P. C. Murley and G. R. Srinivasan, "Soft-Error Monte Carlo Modeling Program, SEMM," IBM J. Res. Develop. 40, No. 1, 109-118 (1996, this issue).
13. J. F. Ziegler, H. P. Muhlfeld, C. J. Montrose, H. W. Curtis, T. J. O'Gorman, and J. M. Ross, "Accelerated Testing for Cosmic Soft-Error Rate," IBM J. Res. Develop. 40, No. 1, 51-72 (1996, this issue).
14. T. J. O'Gorman, "The Effect of Cosmic Rays on the Soft Error Rate of a DRAM at Ground Level," IEEE Trans. Electron Devices 41, No. 4, 553-557 (April 1994).
15. B. F. Fitzgerald and E. P. Thoma, "A 288K-bit Dynamic Random Access Memory," ISSCC Digest, p. 64 (February 1982).
16. C. M. Hsieh, P. C. Murley, and R. R. O'Brien, "Collection of Charge from Alpha-Particle Tracks in Silicon Devices," IEEE Trans. Electron Devices ED-30, No. 6, 686-693 (June 1983).
17. Radiological Health Handbook, U.S. Dept. of Health, Education, and Welfare, Washington, DC, January 1970, pp. 110-113.
18. Z. Hasnain and A. Ditali, "Building-In Reliability: Soft Errors - A Case Study," Proceedings of the 30th Annual IEEE International Reliability Physics Symposium, 1992, pp. 276-280.
19. R. Saxena, "Ground Level Atmospheric Neutron Flux Measurements in the 10-170 MeV Range," Ph.D. thesis, University of New Hampshire, May 1990.
20. J. F. Ziegler, "Terrestrial Cosmic Rays," IBM J. Res. Develop. 40, No. 1, 19-39 (1996, this issue).
21. C. Lage, D. Burnett, T. McNelly, K. Baker, A. Bormann, D. Dreier, and V. Soorholtz, "Soft Error Rate and Stored Charge Requirements in Advanced High-Density SRAMs," IEDM Tech. Digest, pp. 821-824 (1993).
22. A. Taber and E. Normand, "Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics," Report No. 92-L75-020, Loral Federal Systems Co., Owego, NY, August 26, 1992.
23. A. Taber and E. Normand, "Single Event Upsets in Avionics," IEEE Trans. Nucl. Sci. 40, 120-126 (April 1993).
24. M. Merker, E. S. Light, H. J. Verschell, R. B. Mendell, and S. A. Korff, "Time Dependent Worldwide Distribution of Atmospheric Neutrons and Their Products," J. Geophys. Res. 78, 2727 (1973).
25. J. Adams, "Cosmic Ray Effects on Microelectronics," Report No. 5901, Naval Research Laboratory, Washington, DC, 1986.
26. J. Hewitt, L. Hughes, J. W. Baum, A. V. Kuehner, J. B. McCaslin, A. Rindi, A. R. Smith, L. D. Stephens, R. H. Thomas, R. V. Griffith, and C. G. Welles, "Ames Collaborative Study of Cosmic Ray Neutrons and Mid-Latitude Flights," Health Phys. 34, 375 (1978).