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Volumn 71, Issue , 2012, Pages 13-18

Numerical investigation on the junctionless nanowire FET

Author keywords

Depletion mode FET; Junctionless field effect transistor (JL FET); Nanowire field effect transistor (NW FET)

Indexed keywords

CYLINDRICAL GEOMETRY; DEPLETION-MODE FET; ELECTROSTATIC POTENTIALS; FUTURE TECHNOLOGIES; I-V AND C-V CHARACTERISTICS; JUNCTIONLESS; NANOWIRE FET; NUMERICAL INVESTIGATIONS; NUMERICAL RESULTS; TURN-ON CHARACTERISTICS;

EID: 84858707995     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2011.10.013     Document Type: Conference Paper
Times cited : (15)

References (13)
  • 2
    • 33646271349 scopus 로고    scopus 로고
    • High-performance fully depleted silicon nanowire (diameter ≤5 nm) gate-all-around CMOS devices
    • N. Singh, A. Agarwal, L.K. Bera, T.Y. Liow, R. Yang, and S.C. Rustagi High-performance fully depleted silicon nanowire (diameter ≤5 nm) gate-all-around CMOS devices IEEE Electron Dev Lett 27 2006 383 385
    • (2006) IEEE Electron Dev Lett , vol.27 , pp. 383-385
    • Singh, N.1    Agarwal, A.2    Bera, L.K.3    Liow, T.Y.4    Yang, R.5    Rustagi, S.C.6
  • 4
    • 50949095454 scopus 로고    scopus 로고
    • Analytical and self-consistent quantum-mechanical model for a surrounding gate MOS nanowire operated in JFET mode
    • B. Soree, W. Magnus, and G. Pourtois Analytical and self-consistent quantum-mechanical model for a surrounding gate MOS nanowire operated in JFET mode J Comput Electron 7 3 2008 380 383
    • (2008) J Comput Electron , vol.7 , Issue.3 , pp. 380-383
    • Soree, B.1    Magnus, W.2    Pourtois, G.3
  • 10
    • 48049102005 scopus 로고    scopus 로고
    • S. Inc. Release Version C-2009.06
    • S. Inc., Sentaurus Device Users' Manual, Release Version C-2009.06; 2009.
    • (2009) Sentaurus Device Users' Manual
  • 13
    • 79151480956 scopus 로고    scopus 로고
    • Sensitivity of threshold voltage to nanowire width variation in junctionless transistors
    • S.-J. Choi, D.-I. Moon, S. Kim, J.P. Duarte, and Y.-K. Choi Sensitivity of threshold voltage to nanowire width variation in junctionless transistors IEEE Electron Dev Lett 32 2011 125
    • (2011) IEEE Electron Dev Lett , vol.32 , pp. 125
    • Choi, S.-J.1    Moon, D.-I.2    Kim, S.3    Duarte, J.P.4    Choi, Y.-K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.