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Volumn 1, Issue 3, 2009, Pages 552-558

The effect of synthesis conditions and humidity on current-voltage relations in electrodeposited ZnO-based schottky junctions

Author keywords

electrical resistivity; electrodeposition; hydrophobic surfaces; metal oxides; rectifying junctions; X ray diffraction

Indexed keywords

ACIDIC DEPOSITION; AG/AGCL; APPLIED VOLTAGES; BARRIER HEIGHTS; ELECTRICAL RESISTIVITY; ELECTRON TRANSPORT MATERIALS; FORWARD-BIASED JUNCTIONS; HUMID ENVIRONMENT; HYDROPHOBIC COATINGS; HYDROPHOBIC SURFACES; METAL OXIDES; ON CURRENTS; POST-DEPOSITION; PREFERRED ORIENTATIONS; PROTONIC CONDUCTION; RECTIFYING JUNCTIONS; RELATIVE HUMIDITIES; SCHOTTKY; SCHOTTKY JUNCTIONS; SOFT BREAKDOWN; SURFACE COATINGS; SYNTHESIS CONDITIONS; WETTING PROPERTY; ZNO; ZNO SURFACE;

EID: 84857739088     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am800049u     Document Type: Article
Times cited : (10)

References (35)
  • 3
    • 0038136910 scopus 로고    scopus 로고
    • Wager, J. F. Science 2003, 300, 1245-1246
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    • Wager, J.F.1
  • 25
    • 0003495856 scopus 로고    scopus 로고
    • Joint Commission on Powder Diffraction Standards, International Centre for Diffraction Data: Newtown Square, PA
    • Powder Diffraction File; Joint Commission on Powder Diffraction Standards, International Centre for Diffraction Data: Newtown Square, PA, 2003; www.icdd.com.
    • (2003) Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.