Optical absorption edge shifts in electrodeposited ZnO thin films

Thin Solid Films

Volumn 515, Issue 20-21, 2007, Pages 7976-7983

  Ren, Tingting ^a   Baker, Holly R ^a   Poduska, Kristin M ^a  

^a MEMORIAL UNIVERSITY OF NEWFOUNDLAND   (Canada)

Author keywords

Diffusion; Electrochemistry; Hydrogen; Optical properties; Raman scattering; Reflection spectroscopy; X ray diffraction; Zinc oxide

Indexed keywords

DIFFUSION; ELECTRODEPOSITION; HYDROGEN; LIGHT ABSORPTION; OPTICAL PROPERTIES; RAMAN SCATTERING; X RAY DIFFRACTION; ZINC OXIDE;

BURSTEIN MOSS EFFECTS; EDGE ENERGY; EDGE SHIFTS; REFLECTION SPECTROSCOPY;

THIN FILMS;

EID: 34547696858     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.03.185     Document Type: Article

References (39)

1. Özgür Ü., Alivov Ya.I., Liu C., Teke A., Reshchikov M.A., Dogan S., Avrutin V., Cho S.-J., and Morkoç H. J. Appl. Phys. 98 (2005) 041301
2. Taunier S., Sicx-Kurdi J., Grand P.P., Chomont A., Ramdani O., Parissi L., Panheleux P., Naghavi N., Hubert C., Ben-Farah M., Fauvaruque J.P., Connolly J., Roussel O., Morgensen P., Mahé E., Guillemoles J.F., Lincot D., and Kerrec O. Thin Solid Films 480-481 (2005) 526
3. Dharmadasa I.M., and Haigh J. J. Electrochem. Soc. 153 (2006) G47
4. Goux A., Pauporté T., Chivot J., and Lincot D. Electrochim. Acta 50 (2005) 2239
5. Marotti R.E., Giorgi P., Machado G., and Dalchiele E.A. Sol. Energy Mater. 90 (2006) 2356
6. Pauportè T., and Lincot D. Electrochim. Acta 45 (2000) 3345
7. Marotti R.E., Guerra D.N., Bello C., Machado G., and Dalchiele E.A. Sol. Energy Mater. Sol. Cells 82 (2004) 85
8. Schindler W., and Kirschner J. Phys. Rev., B 55 (1997) R1989
9. Van de Walle C.G., and Neugebauer J. Nature 423 (2003) 626
10. Van de Walle C.G. Phys. Rev. Lett. 85 (2000) 1012
11. Cox S.F.J., Davis E.A., Cottrell S.P., King P.J.C., Lord J.S., Gil J.M., Alberto H.V., Vilao R.C., Piroto Duarte J., Ayres de Campos N., Weidinger A., Lichti R.L., and Irvine S.J.C. Phys. Rev. Lett. 86 (2001) 2601
12. Nickel N.H., and Fleischer K. Phys. Rev. Lett. 90 (2003) 197402
13. Burstein E. Phys. Rev. 93 (1954) 632
14. Peulon S., and Lincot D. J. Electrochem. Soc. 145 (1998) 864
15. Yoshida T., Komatsu D., Shimokawa N., and Minoura H. Thin Solid Films 451-452 (2004) 166
16. Izaki M., and Omi T. J. Electrochem. Soc. 143 (1996) L53
17. Canava B., and Lincot D. J. Appl. Electrochem. 30 (2000) 711
18. Lee J., Nam S.C., and Tak Y. Korean J. Chem. Eng. 22 (2005) 161
19. Bizzotto D. Cyclic voltammetry virtual instrument and libraries for use with National Instruments LabVIEW (2006). http://www.chem.ubc.ca/faculty/bizzotto/instrumentation.html
20. Schwarzenbach D. LATCON: Program for the LS-refinement of Lattice Constants (1975), Uni Lausanne, Switzerland
21. Gal D., Mastai Y., Hodes G., and Kronik L. J. Appl. Phys. 86 (1999) 5573
22. Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 2003, Card 36-1451.
23. Lee J.-S., and Maier J. J. Mater. Res. 20 (2005) 2101
24. Srikant V., and Clarke D.R. J. Appl. Phys. 81 (1997) 6357
25. Enríquez J.P., and Mathew X. Sol. Energy Mater. Sol. Cells 76 (2003) 313
26. Jokela S.J., McCluskey M.D., and Lynn K.G. Physica, B 340 (2003) 221
27. Izaki M., and Saijo Y. J. Electrochem. Soc. 150 (2003) C73
28. Barquinha P., Fortunato E., Gonçalves A., Pimentel A., Marques A., Pereira L., and Martins R. Superlattices and Microstruct. 39 (2006) 319
29. Alim K.A., Fonoberov V.A., and Balandin A.A. Appl. Phys. Lett. 86 (2005) 053103
30. Chen Z.Q., Kawasuso A., Xu Y., Naramoto H., Yan X.L., Sekiguchi T., Suzuki R., and Ohdaira T. Phys. Rev., B 71 (2005) 115213
31. Decremps F., Pellicer-Porres J., Saitta A.M., Chervin J., and Polian A. Phys. Rev., B 65 (2002) 092101
32. Zhang Y., Jia H., Wang R., Chen C., Luo X., Yu D., and Lee C. Appl. Phys. Lett. 83 (2003) 4631
33. Janotti A., and Van de Walle C. J. Cryst. Growth 287 (2006) 58
34. Jayaraj M.K., Antony A., and Ramachandran M. Bull. Mater. Sci. 25 (2002) 227
35. Chen L.-Y., Chen W.-H., Wang J.-J., Hong F.C.-N., and Su Y.-K. Appl. Phys. Lett. 85 (2004) 5628
36. Damen T.C., Porto S.P.S., and Tell B. Phys. Rev. 142 (1966) 570
37. Bergman L., Chen X.-B., Huso J., Morrison J.L., and Hoeck H. J. Appl. Phys. 98 (2005) 093507
38. Exarhos G.J., and Sharma S.K. Thin Solid Films 270 (1995) 27
39. Wardle M.G., Gross J.P., and Briddon P.R. Phys. Rev. Lett. 96 (2006) 205504