The local structure of amorphous silicon

Science

Volumn 335, Issue 6071, 2012, Pages 950-953

  Treacy, M M J ^a   Borisenko, K B ^b,c  

^a ARIZONA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE;

AMORPHOUS MEDIUM; DATA SET; DIFFRACTION; ELECTRON MICROSCOPY; EXPERIMENTAL STUDY; HOMOGENEITY; NUMERICAL MODEL; SILICON; TOPOLOGY; TRANSFORMATION;

ARTICLE; CHEMICAL STRUCTURE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; PRIORITY JOURNAL;

EID: 84857572527     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1214780     Document Type: Article

References (38)

1. U. R. Pedersen, T. B. Schrøder, J. C. Dyre, P. Harrowell, Phys. Rev. Lett. 104, 105701 (2010).
2. H. Tanaka, T. Kawasaki, H. Shintani, K. Watanabe, Nat. Mater. 9, 324 (2010).
3. N. Jakse, A. Pasturel, Appl. Phys. Lett. 93, 113104 (2008).
4. Y. Q. Cheng, H. W. Sheng, E. Ma, Phys. Rev. B 78, 014207 (2008).
5. B.-S. Lee et al., Science 326, 980 (2009).
6. T. H. Lee, S. R. Elliott, Phys. Rev. Lett. 107, 145702 (2011).
7. S. Pauly, S. Gorantla, G. Wang, U. Kühn, J. Eckert, Nat. Mater. 9, 473 (2010).
8. W. H. Zachariasen, J. Am. Chem. Soc. 54, 3841 (1932).
9. F. Wooten, K. Winer, D. Weaire, Phys. Rev. Lett. 54, 1392 (1985).
10. G. T. Barkema, N. Mousseau, Phys. Rev. B 62, 4985 (2000).
11. R. L. C. Vink, G. T. Barkema, W. F. van der Weg, N. Mousseau, J. Non-Cryst. Solids 282, 248 (2001).
12. R. L. C. Vink, G. T. Barkema, M. A. Stijnman, R. H. Bisseling, Phys. Rev. B 64, 245214 (2001).
13. K. Laaziri et al., Phys. Rev. B 60, 13520 (1999).
14. D. J. H. Cockayne, Annu. Rev. Mater. Res. 37, 159 (2007).
15. R. L. C. Vink, G. T. Barkema, W. F. van der Weg, Phys. Rev. B 63, 115210 (2001).
16. W. A. Kamitakahara, C. M. Soukoulis, H. R. Shanks, U. Buchenau, G. S. Grest, Phys. Rev. B 36, 6539 (1987).
17. R. Hosemann, S. N. Baggchi, Direct Analysis of Diffraction by Matter (North-Holland, Amsterdam, 1962).
18. D. Turnbull, D. Polk, J. Non-Cryst. Solids 8-10, 19 (1972).
19. M. M. J. Treacy, J. M. Gibson, P. J. Keblinski, J. Non-Cryst. Solids 231, 99 (1998).
20. P. M. Voyles, J. E. Gerbi, M. M. J. Treacy, J. M. Gibson, J. R. Abelson, Phys. Rev. Lett. 86, 5514 (2001).
21. S. N. Bogle, P. M. Voyles, S. V. Khare, J. R. Abelson, J. Phys. Condens. Matter 19, 455204 (2007).
22. J. M. Gibson, M. M. J. Treacy, T. Sun, N. J. Zaluzec, Phys. Rev. Lett. 105, 125504 (2010).
23. A. C. Wright, Phys. Chem. Glasses Eur. J. Glass Sci. Technol. B 49, 103 (2008).
24. S. C. Moss, J. F. Graczyk, Phys. Rev. Lett. 23, 1167 (1969).
25. P. Biswas, R. Atta-Fynn, D. A. Drabold, Phys. Rev. B 69, 195207 (2004).
26. K. B. Borisenko et al., Acta Mater. 60, 359 (2012).
27. P. Biswas, D. Tafen, D. A. Drabold, Phys. Rev. B 71, 054204 (2005).
28. J. Hwang, A. M. Clausen, H. Cao, P. M. Voyles, J. Mater. Res. 24, 3121 (2009).
29. J. Tersoff, Phys. Rev. B 38, 9902 (1988).
30. W. H. Press, S. A. Teukolsky, W. T. Vetterling, B. P. Flannery, Numerical Recipes in C (Cambridge Univ. Press, Cambridge, 1992).
31. B. Haberl et al., Phys. Rev. B 79, 155209 (2009).
32. See supporting material on Science Online.
33. C. S. Marians, L. W. Hobbs, J. Non-Cryst. Solids 124, 242 (1990).
34. M. M. J. Treacy, P. M. Voyles, J. M. Gibson, J. Non-Cryst. Solids 266-269, 150 (2000).
35. P. M. Voyles, D. A. Muller, Ultramicroscopy 93, 147 (2002).
36. J. M. Gibson, J.-Y. Cheng, P. M. Voyles, M. M. J. Treacy, D. C. Jacobson, Microstructural Processes in Irradiated Materials, S. J. Zinkle, G. Lucas, R. Ewing, Eds. (Materials Research Society, Warrendale, PA, 1999), vol. 540, pp. 27-32.
37. G. Zhao, P. R. Buseck, A. Rougée, M. M. J. Treacy, Ultramicroscopy 109, 177 (2009).
38. D. A. Keen, R. McGreevy, Nature 344, 423 (1990).