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Volumn 41, Issue 2, 2011, Pages 247-253
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Study of atomic layer deposition of ZnO on a polar oxide substrate by in-situ quartz crystal microbalance
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALS;
DEIONIZED WATER;
FILM GROWTH;
GROWTH RATE;
II-VI SEMICONDUCTORS;
MAGNESIA;
METALLIC FILMS;
OPTICAL FILMS;
OXIDE FILMS;
QUARTZ;
QUARTZ CRYSTAL MICROBALANCES;
SUBSTRATES;
SURFACE ROUGHNESS;
THIN FILMS;
ZINC OXIDE;
DIETHYL ZINC;
EX SITU;
POLAR OXIDES;
PULSE TIME;
SITU QUARTZ CRYSTAL MICROBALANCE;
TEMPERATURE WINDOW;
ZNO FILMS;
ZNO THIN FILM;
ATOMIC LAYER DEPOSITION;
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EID: 84857247415
PISSN: 19385862
EISSN: 19386737
Source Type: Conference Proceeding
DOI: 10.1149/1.3633674 Document Type: Conference Paper |
Times cited : (5)
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References (14)
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