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Volumn 42, Issue 1-3, 1996, Pages 306-310

Images of grain boundaries in polycrystalline silicon solar cells by electron and ion beam induced charge collection

a CNR (Italy)

Author keywords

Electron beam; Grain boundaries; Solar cells

Indexed keywords

ELECTRON BEAMS; GRAIN BOUNDARIES; IMAGING TECHNIQUES; INDUCED CURRENTS; ION BEAMS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY;

CHARGE COLLECTION; CHARGE PULSES; ELECTRON BEAM INDUCED CURRENT (EBIC) TECHNIQUE; ION BEAM INDUCED CHARGE (IBIC) METHOD;

SILICON SOLAR CELLS;

EID: 0030380832 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(96)01955-1 Document Type: Article

Times cited : (11)

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