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Volumn , Issue , 2002, Pages 504-507
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Charge carrier transport in polycrystalline CuGaSe2 thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
COPPER COMPOUNDS;
CRYSTAL DEFECTS;
ELECTRIC CONDUCTIVITY MEASUREMENT;
FERMI LEVEL;
GRAIN BOUNDARIES;
HALL EFFECT;
PHYSICAL VAPOR DEPOSITION;
POLYCRYSTALLINE MATERIALS;
SEMICONDUCTOR DOPING;
THERMAL EFFECTS;
TRANSPORT PROPERTIES;
COPPER GALLIUM SELENIDE;
DOPING CONCENTRATION;
GRAIN MOBILITY;
THIN FILMS;
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EID: 0036953496
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (48)
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References (17)
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