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Applied Physics Letters

Volumn 99, Issue 17, 2011, Pages

Symmetry-dependence of electronic grain boundary properties in polycrystalline CuInSe2 thin films

(5) Baier, Robert a Abou Ras, Daniel a Rissom, Thorsten a Lux Steiner, Martha Ch a Sadewasser, Sascha a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY PROPERTY; CU(IN , GA)SE; ELECTRON BACK SCATTER DIFFRACTION; KELVIN PROBE FORCE MICROSCOPY; POLYCRYSTALLINE;

COPPER COMPOUNDS; ELECTRONIC PROPERTIES; GALLIUM; GRAIN SIZE AND SHAPE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS;

GRAIN BOUNDARIES;

EID: 80555145198 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3652915 Document Type: Article

Times cited : (35)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.