Raman scattering characterization of Si(100) implanted with mega-electron-volt Sb

Journal of Applied Physics

Volumn 87, Issue 3, 2000, Pages 1110-1117

  Dey, Soma ^a   Roy, Chaitali ^b   Pradhan, Asima ^b   Varma, Shikha ^a  

^a INSTITUTE OF PHYSICS   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011969690     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371987     Document Type: Article

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