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Volumn 75, Issue 2, 2012, Pages

Studies of nanomagnetism using synchrotron-based x-ray photoemission electron microscopy (X-PEEM)

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EID: 84856442021     PISSN: 00344885     EISSN: None     Source Type: Journal    
DOI: 10.1088/0034-4885/75/2/026501     Document Type: Review
Times cited : (71)

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