Exploring the microscopic origin of exchange bias with photoelectron emission microscopy (invited)

Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 7266-7268

  Scholl, A ^a   Nolting, F ^a,b   Stohr J ^b   Regan, T ^c   Luning J ^b   Seo, J W ^d,e   Locquet, J P ^d   Fompeyrine, J ^d   Anders, S ^a,f   Ohldag, H ^a,b,g   Padmore, H A ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c STANFORD UNIVERSITY   (United States)

^d IBM RESEARCH ZURICH   (Switzerland)

^e UNIVERSITY OF NEUCHÂTEL   (Switzerland)

^f IBM ALMADEN RESEARCH CENTER   (United States)

^g HEINRICH HEINE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356777     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1358828     Document Type: Article

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