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Journal of Electron Spectroscopy and Related Phenomena

Volumn 124, Issue 2-3, 2002, Pages 175-194

Application and future of photoelectron spectromicroscopy

(1) Kinoshita, Toyohiko a

a UNIVERSITY OF TOKYO (Japan)

Author keywords

Imaging; Photoemission; Spectromicroscopy

Indexed keywords

IMAGE ANALYSIS; LIGHT POLARIZATION; MAGNETIC DOMAINS; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PHOTOEMISSION; SURFACE CHEMISTRY; SYNCHROTRON RADIATION; X RAYS;

PHOTOELECTRON EMISSION MICROSCOPY (PEEM); PHOTOELECTRON SPECTROMICROSCOPY; X-RAY MAGNETIC DICHROISM SPECTROSCOPY;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036643694 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/S0368-2048(02)00053-1 Document Type: Article

Times cited : (16)

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