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Volumn 34, Issue 5, 2012, Pages 786-789
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Control and characterization of structural and optical properties of ZnO thin films fabricated by thermal oxidation Zn metallic films
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Author keywords
Rapid thermal oxidation; Transparent oxide semiconductor; Zinc oxide
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Indexed keywords
AMORPHOUS FILMS;
FABRICATION;
II-VI SEMICONDUCTORS;
INFRARED DEVICES;
METALLIC FILMS;
MICROELECTRONICS;
OPTICAL FILMS;
OPTICAL PROPERTIES;
OXIDE FILMS;
OXIDE SEMICONDUCTORS;
RAPID THERMAL PROCESSING;
THERMOOXIDATION;
WIDE BAND GAP SEMICONDUCTORS;
ZINC OXIDE;
COMPARATIVE CHARACTERIZATIONS;
IN-DEPTH UNDERSTANDING;
NEAR BAND EDGE EMISSIONS;
OPTOELECTRONIC APPLICATIONS;
RAPID THERMAL OXIDATION;
STRUCTURAL AND OPTICAL PROPERTIES;
TRANSPARENT OXIDE SEMICONDUCTOR;
VISIBLE AND NEAR INFRARED;
THIN FILMS;
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EID: 84856236095
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optmat.2011.11.005 Document Type: Article |
Times cited : (14)
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References (28)
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